Two-axis sagittal focusing monochromator

Haas, Edwin G; Stelmach, Christopher; Zhong, Zhong

Title: Two-axis sagittal focusing monochromator

Patent · Tue May 13 00:00:00 EDT 2014

OSTI ID:1130971

Haas, Edwin G; Stelmach, Christopher; Zhong, Zhong

An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders mounted on a rigid, open frame such that x-rays may pass through the opening in the frame. The added x-ray flux allows significantly higher brightness from the same x-ray source.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC02-98CH10886

Assignee:: Brookhaven Science Associates, LLC (Upton, NY)

Patent Number(s):: 8,724,776

Application Number:: 13/227,517

OSTI ID:: 1130971

Resource Relation:: Patent File Date: 2011 Sep 08

Country of Publication:: United States

Language:: English

References (11)

Kinematic X-ray analyses apparatus Brinkgreve, Peter; Koningsberger, Diederik C. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/4637041 US Patent Document 4,637,041	patent	January 1987
X-ray analysis apparatus including a monochromator crystal having crystal lattice surfaces Hornstra, Jan; Viegers, Mathias P. A. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/4649557 US Patent Document 4,649,557	patent	March 1987
X-ray spectrometer having a doubly curved crystal Huizing, Albert Gezinus; Zegers, Cornelis P. G. M.; Heijmans, Teunis J. A. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/4949367 US Patent Document 4,949,367	patent	August 1990
Curved crystal x-ray optical device and method of fabrication Wittry, David B. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6236710 US Patent Document 6,236,710	patent	May 2001
X-ray imaging crystal spectrometer for extended X-ray sources Bitter, Manfred; Fraenkel, Ben; Gorman, James L. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6259763 US Patent Document 6,259,763	patent	July 2001
Method and apparatus for fabricating curved crystal x-ray optics Wittry, David B. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6498830 US Patent Document 6,498,830	patent	December 2002
Total-reflection x-ray fluorescence apparatus and method using a doubly-curved optic Chen, Zewu https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6829327 US Patent Document 6,829,327	patent	December 2004
Sagittal focusing Laue monochromator Zhong, Zhong; Hanson, Jonathan; Hastings, Jerome https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7508912 US Patent Document 7,508,912	patent	March 2009
Sagittal Focusing Laue Monochromator Zhong, Zhong; Hanson, Jonathan; Hastings, Jerome https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080247512 US Patent Application 11/693900; 20080247512	patent-application	October 2008
Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending Yang, Wenge; Larson, B. C.; Ice, G. E. Applied Physics Letters, Vol. 82, Issue 22 https://doi.org/10.1063/1.1579857	journal	June 2003
Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. II. Experimental studies Zhong, Z.; Kao, C. C.; Siddons, D. P. Journal of Applied Crystallography, Vol. 34, Issue 5, p. 646-653 https://doi.org/10.1107/S0021889801010627	journal	September 2001

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