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Title: Scanning coherent x-ray microscopy as a tool for XFEL nanobeam characterization

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1128869
Report Number(s):
SLAC-REPRINT-2014-065
DOE Contract Number:
AC02-76SF00515
Resource Type:
Journal Article
Resource Relation:
Journal Name: Proc.SPIE Int.Soc.Opt.Eng. 8849:88490R,2013
Research Org:
SLAC National Accelerator Laboratory (SLAC)
Sponsoring Org:
US DOE Office of Science (DOE SC)
Country of Publication:
United States
Language:
English
Subject:
XFEL