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Title: Sub-microsecond-resolution probe microscopy

Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
1128706
Report Number(s):
8,686,358
13/232,859
DOE Contract Number:
SC0001084
Resource Type:
Patent
Research Org:
University of Washington, Center for Commercialization, Seattle, WA, USA
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION