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Title: LAr TPC Electronics CMOS Lifetime at 300 K and 77 K and Reliability Under Thermal Cycling

Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
1123658
Report Number(s):
BNL--103771-2014-JA
KA-04
DOE Contract Number:
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: IEEE Transactions on Nuclear Science; Journal Volume: 60
Research Org:
Brookhaven National Laboratory (BNL)
Sponsoring Org:
USDOE SC OFFICE OF SCIENCE (SC)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY