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Title: Focused ion beam and scanning electron microscopy for 3D materials characterization.

Abstract not provided.
Authors:
; ;
Publication Date:
OSTI Identifier:
1122448
Report Number(s):
SAND2013-10396J
491554
DOE Contract Number:
DE-AC04-94AL85000
Resource Type:
Journal Article
Resource Relation:
Journal Name: MRS Bulletin; Related Information: Proposed for publication in MRS Bulletin.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English