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Title: Thermal Conductivity in Nanocrystalline Ceria Thin Films

The thermal conductivity of nanocrystalline ceria films grown by unbalanced magnetron sputtering is determined as a function of temperature using laser-based modulated thermoreflectance. The films exhibit significantly reduced conductivity compared with stoichiometric bulk CeO2. A variety of microstructure imaging techniques including X-ray diffraction, scanning and transmission electron microscopy, X-ray photoelectron analysis, and electron energy loss spectroscopy indicate that the thermal conductivity is influenced by grain boundaries, dislocations, and oxygen vacancies. The temperature dependence of the thermal conductivity is analyzed using an analytical solution of the Boltzmann transport equation. The conclusion of this study is that oxygen vacancies pose a smaller impediment to thermal transport when they segregate along grain boundaries.
Authors:
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Publication Date:
OSTI Identifier:
1122113
Report Number(s):
INL/JOU-14-31404
Journal ID: ISSN 0002-7820
DOE Contract Number:
DE-AC07-05ID14517
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of the American Ceramic Society; Journal Volume: 97; Journal Issue: 2
Research Org:
Idaho National Laboratory (INL)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
99 GENERAL AND MISCELLANEOUS ceria