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Title: THE INFLUENCE OF NEUTRON-IRRADIATION AT LOW TEMPERATURES ON THE DIELECTRIC PARAMETERS OF 3C-SiC

3C-SiC wafers were irradiated with neutrons of various fluences and at low (200 - 400 ?C) irradiation temperatures. Fourier Transform infrared (FTIR) reflectance spectra were obtained for the samples, and the spectra used to extract the dielectric parameters for each specimen, using statistical curve-fitting procedures. Analysis of all data revealed trends in reflectance peak heights as well as in the dielectric parameters. The surface roughness of the irradiated samples was measured by atomic force spectroscopy (AFM) and certain trends could be ascribed to surface roughness.
Authors:
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Publication Date:
OSTI Identifier:
1122110
Report Number(s):
INL/JOU-13-29473
Journal ID: ISSN 0921-4526
DOE Contract Number:
DE-AC07-05ID14517
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physica B: Condensed Matter; Journal Volume: 439
Research Org:
Idaho National Laboratory (INL)
Sponsoring Org:
DOE - NE
Country of Publication:
United States
Language:
English
Subject:
11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS 3C-SiC; infrared reflectance; neutron irradiation