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Title: Investigations of shot reproducibility for the SMP diode at 4.5 MV.

Abstract

In experiments conducted on the RITS-6 accelerator, the SMP diode exhibits sig- ni cant shot-to-shot variability. Speci cally, for identical hardware operated at the same voltage, some shots exhibit a catastrophic drop in diode impedance. A study is underway to identify sources of shot-to-shot variations which correlate with diode impedance collapse. To remove knob emission as a source, only data from a shot series conducted with a 4.5-MV peak voltage are considered. The scope of this report is limited to sources of variability which occur away from the diode, such as power ow emission and trajectory changes, variations in pulsed power, dustbin and transmission line alignment, and di erent knob shapes. We nd no changes in the transmission line hardware, alignment, or hardware preparation methods which correlate with impedance collapse. However, in classifying good versus poor shots, we nd that there is not a continuous spectrum of diode impedance behavior but that the good and poor shots can be grouped into two distinct impedance pro les. This result forms the basis of a follow-on study focusing on the variability resulting from diode physics. 3

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2]; ; ; ; ; ; ; ; ; ; more »; « less
  1. National Security Technologies, LLC, Las Vegas, NV (United States)
  2. Voss Scientific, LLC, Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1121975
Report Number(s):
SAND2013-9863
482862
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
24 POWER TRANSMISSION AND DISTRIBUTION

Citation Formats

Bennett, Nichelle, Crain, Marlon D., Droemer, Darryl W., Gignac, Raymond Edward, Lare, Gregory A., Molina, Isidro, Obregon, Rafael, Smith, Chase C., Wilkins, Frank Lee, Welch, Dale Robert, Cordova, Steve Ray, Gallegos, M., Johnston, Mark D., Kiefer, Mark Linden, Leckbee, Joshua J., Nielsen, Daniel Scott, Oliver, Bryan Velten, Renk, Timothy Jerome, Romero, Tobias, Webb, Timothy Jay, and Ziska, Derek Raymond. Investigations of shot reproducibility for the SMP diode at 4.5 MV.. United States: N. p., 2013. Web. doi:10.2172/1121975.
Bennett, Nichelle, Crain, Marlon D., Droemer, Darryl W., Gignac, Raymond Edward, Lare, Gregory A., Molina, Isidro, Obregon, Rafael, Smith, Chase C., Wilkins, Frank Lee, Welch, Dale Robert, Cordova, Steve Ray, Gallegos, M., Johnston, Mark D., Kiefer, Mark Linden, Leckbee, Joshua J., Nielsen, Daniel Scott, Oliver, Bryan Velten, Renk, Timothy Jerome, Romero, Tobias, Webb, Timothy Jay, & Ziska, Derek Raymond. Investigations of shot reproducibility for the SMP diode at 4.5 MV.. United States. https://doi.org/10.2172/1121975
Bennett, Nichelle, Crain, Marlon D., Droemer, Darryl W., Gignac, Raymond Edward, Lare, Gregory A., Molina, Isidro, Obregon, Rafael, Smith, Chase C., Wilkins, Frank Lee, Welch, Dale Robert, Cordova, Steve Ray, Gallegos, M., Johnston, Mark D., Kiefer, Mark Linden, Leckbee, Joshua J., Nielsen, Daniel Scott, Oliver, Bryan Velten, Renk, Timothy Jerome, Romero, Tobias, Webb, Timothy Jay, and Ziska, Derek Raymond. 2013. "Investigations of shot reproducibility for the SMP diode at 4.5 MV.". United States. https://doi.org/10.2172/1121975. https://www.osti.gov/servlets/purl/1121975.
@article{osti_1121975,
title = {Investigations of shot reproducibility for the SMP diode at 4.5 MV.},
author = {Bennett, Nichelle and Crain, Marlon D. and Droemer, Darryl W. and Gignac, Raymond Edward and Lare, Gregory A. and Molina, Isidro and Obregon, Rafael and Smith, Chase C. and Wilkins, Frank Lee and Welch, Dale Robert and Cordova, Steve Ray and Gallegos, M. and Johnston, Mark D. and Kiefer, Mark Linden and Leckbee, Joshua J. and Nielsen, Daniel Scott and Oliver, Bryan Velten and Renk, Timothy Jerome and Romero, Tobias and Webb, Timothy Jay and Ziska, Derek Raymond},
abstractNote = {In experiments conducted on the RITS-6 accelerator, the SMP diode exhibits sig- ni cant shot-to-shot variability. Speci cally, for identical hardware operated at the same voltage, some shots exhibit a catastrophic drop in diode impedance. A study is underway to identify sources of shot-to-shot variations which correlate with diode impedance collapse. To remove knob emission as a source, only data from a shot series conducted with a 4.5-MV peak voltage are considered. The scope of this report is limited to sources of variability which occur away from the diode, such as power ow emission and trajectory changes, variations in pulsed power, dustbin and transmission line alignment, and di erent knob shapes. We nd no changes in the transmission line hardware, alignment, or hardware preparation methods which correlate with impedance collapse. However, in classifying good versus poor shots, we nd that there is not a continuous spectrum of diode impedance behavior but that the good and poor shots can be grouped into two distinct impedance pro les. This result forms the basis of a follow-on study focusing on the variability resulting from diode physics. 3},
doi = {10.2172/1121975},
url = {https://www.osti.gov/biblio/1121975}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Nov 01 00:00:00 EDT 2013},
month = {Fri Nov 01 00:00:00 EDT 2013}
}