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Title: Semiconductor detectors with proximity signal readout

Semiconductor-based radiation detectors are routinely used for the detection, imaging, and spectroscopy of x-rays, gamma rays, and charged particles for applications in the areas of nuclear and medical physics, astrophysics, environmental remediation, nuclear nonproliferation, and homeland security. Detectors used for imaging and particle tracking are more complex in that they typically must also measure the location of the radiation interaction in addition to the deposited energy. In such detectors, the position measurement is often achieved by dividing or segmenting the electrodes into many strips or pixels and then reading out the signals from all of the electrode segments. Fine electrode segmentation is problematic for many of the standard semiconductor detector technologies. Clearly there is a need for a semiconductor-based radiation detector technology that can achieve fine position resolution while maintaining the excellent energy resolution intrinsic to semiconductor detectors, can be fabricated through simple processes, does not require complex electrical interconnections to the detector, and can reduce the number of required channels of readout electronics. Proximity electrode signal readout (PESR), in which the electrodes are not in physical contact with the detector surface, satisfies this need.
Authors:
 [1]
  1. XIA, LLC, Hayward, CA (United States)
Publication Date:
OSTI Identifier:
1120945
Report Number(s):
DOE-XIA--0000676
TRN: US1400119
DOE Contract Number:
SC0006317
Resource Type:
Technical Report
Research Org:
XIA, LLC, Hayward, CA (United States)
Sponsoring Org:
USDOE
Contributing Orgs:
Lawrence Berkeley National Laboratory (United States)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY Proximity Contacts, Segmented Planar detectors, Germanium