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Title: 2.6 MeV Proton Irradiation Effects on the Surface Integrity of Depleted UO2

The effect of low temperature proton irradiation in depleted uranium dioxide was examined as a function of fluence. With 2.6 MeV protons, the fluence limit for preserving a good surface quality was found to be relatively low, about 1.4 and 7.0 x 1017 protons/cm2 for single and poly crystalline samples, respectively. Upon increasing the fluence above this threshold, severe surface flaking and disintegration of samples was observed. Based on scanning electron microscopy (SEM) and X-ray diffraction (XRD) observations the causes of surface failure were associated to high H atomic percent at the peak damage region due to low solubility of H in UO2. The resulting lattice stress is believed to exceed the fracture stress of the crystal at the observed fluencies. The oxygen point defects from the displacement damage may hinder the H diffusion and further increase the lattice stress, especially at the peak damage region.
Authors:
 [1] ;  [1] ;  [1] ;  [2] ;  [3] ;  [4] ;  [2] ;  [5]
  1. Univ. of Wisconsin-Madison, Madison, WI (United States). Dept. of Engineering Physics
  2. Idaho National Laboratory (INL), Idaho Falls, ID (United States)
  3. Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
  4. Purdue Univ., West Lafayette, IN (United States). School of Nuclear Engineering
  5. (United States). Dept. of Engineering Physics
Publication Date:
OSTI Identifier:
1120809
Report Number(s):
INL/JOU--13-30694
Journal ID: ISSN 0168-583X; TRN: US1400358
DOE Contract Number:
DE-AC07-05ID14517
Resource Type:
Journal Article
Resource Relation:
Journal Name: Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms; Journal Volume: 319
Publisher:
Elsevier
Research Org:
Idaho National Laboratory (INL), Idaho Falls, ID (United States)
Sponsoring Org:
DOE - SC
Country of Publication:
United States
Language:
English
Subject:
11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS Proton irradiation; Surface Integrity; UO2; MICROSTRUCTURE