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Title: Reliable High-Performance Gate Oxides for Wide Band Gap Devices.

Abstract not provided.
Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
1114585
Report Number(s):
SAND2013-8721C
476964
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the DOE Office of Electricity and Energy Storage Peer Review held October 21-25, 2013 in San Diego, CA.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English