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Title: Total Ionizing Dose and Displacement Damage Effects in Embedded Memory Technologies (Tutorial Presentation).

Abstract not provided.
Authors:
;
Publication Date:
OSTI Identifier:
1111319
Report Number(s):
SAND2013-7898C
474302
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Radiation Effects on Components and Systems: 2013 Conference held September 23-27, 2013 in Oxford, United Kindom.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English