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Title: Method and apparatus for measuring properties of a compound

A system that incorporates teachings of the present disclosure may include, for example, an apparatus having a collimator having at least one aperture and a fluorescence detector. The collimator can be positioned next to a compound. The compound can emit fluorescence X-rays when impacted by an X-ray beam generated by an X-ray source. The collimator can absorb at least a first portion of the fluorescence X-rays emitted by the compound and release at least a second portion of the fluorescence X-rays at the at least one aperture. The second portion of the fluorescence X-rays released by the at least one aperture have known directional information based on a position of the collimator. The fluorescence detector can detect the second portion of the fluorescence X-rays released by the at least one aperture. A three-dimensional (3-D) rendering of an elemental distribution of the compound can be determined from the fluorescence X-rays detected and the directional information. Additional embodiments are disclosed.
Authors:
Publication Date:
OSTI Identifier:
1107596
Report Number(s):
8,565,376
12/986,160
DOE Contract Number:
AC02-06CH11357
Resource Type:
Patent
Research Org:
ANL (Argonne National Laboratory (ANL), Argonne, IL (United States))
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION