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Title: Update on Elevated Temperature Reliability Testing of 1200 V SiC MOSFETs.

Abstract not provided.
Authors:
; ; ; ; ;
Publication Date:
OSTI Identifier:
1107188
Report Number(s):
SAND2013-6974C
465842
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the ARL SiC MOS Program Review held August 22-23, 2013 in College Park, MD.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English