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Title: Thickness and Angular Dependence of the L-Edge X-Ray Absorption of Nickel Thin Films

Authors:
; ; ;
Publication Date:
OSTI Identifier:
1092837
Report Number(s):
SLAC-REPRINT-2013-667
DOE Contract Number:
AC02-76SF00515
Resource Type:
Journal Article
Resource Relation:
Journal Name: X-ray Spectrom. 40:427-431,2011
Research Org:
SLAC National Accelerator Laboratory (SLAC)
Sponsoring Org:
US DOE Office of Science (DOE SC)
Country of Publication:
United States
Language:
English
Subject:
XFEL