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Title: Projection Optics for Extreme Ultraviolet Lithography (EUVL) Microfield Exposure Tools (METs) with a Numerical Aperture of 0.5

Conference ·
OSTI ID:1088484

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
1088484
Report Number(s):
LLNL-PROC-641036
Resource Relation:
Conference: Presented at: Extreme Ultraviolet (EUV) Lithography IV, part of SPIE Advanced Lithography, San Jose, CA, United States, Feb 24 - Feb 28, 2013
Country of Publication:
United States
Language:
English