Synchrotron X-ray Tests of an L-Shaped Laterally Graded Multilayer Mirror for the Analyzer System of the Ultra-High Resolution IXS Spectrometer at NSLS-II
Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS-II). The characterization includes point-to-point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). The synchrotron X-ray test of the mirror was carried out reversely as a focusing device. The results show that the L-shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS-II.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE SC OFFICE OF SCIENCE (SC)
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 1034723
- Report Number(s):
- BNL-96484-2011-JA; JSYRES; KA-04; TRN: US1200907
- Journal Information:
- Journal of Synchrotron Radiation, Vol. 18, Issue 6; ISSN 0909-0495
- Country of Publication:
- United States
- Language:
- English
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