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Title: Synchrotron X-ray Tests of an L-Shaped Laterally Graded Multilayer Mirror for the Analyzer System of the Ultra-High Resolution IXS Spectrometer at NSLS-II

Journal Article · · Journal of Synchrotron Radiation

Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS-II). The characterization includes point-to-point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). The synchrotron X-ray test of the mirror was carried out reversely as a focusing device. The results show that the L-shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS-II.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE SC OFFICE OF SCIENCE (SC)
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
1034723
Report Number(s):
BNL-96484-2011-JA; JSYRES; KA-04; TRN: US1200907
Journal Information:
Journal of Synchrotron Radiation, Vol. 18, Issue 6; ISSN 0909-0495
Country of Publication:
United States
Language:
English

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Cited By (4)

Advances in high-resolution RIXS for the study of excitation spectra under high pressure journal July 2016
The Ultrahigh Resolution IXS Beamline of NSLS-II: Recent Advances and Scientific Opportunities journal March 2013
Magnetic Circular Dichroism in X-Ray Emission from Ferromagnets journal September 2017
Materials characterization by synchrotron x-ray microprobes and nanoprobes journal June 2018