Characterization of durable nanostructured thin film catalysts tested under transient conditions using analytical aberration-corrected electron microscopy

Conference · Sat Jan 01 00:00:00 EST 2011

OSTI ID:1029213

Cullen, David A ^[1]; More, Karren Leslie ^[1]; Reeves, Kimberly Shawn ^[1]; Vernstrom, George ^[2]; Atanasoska, Liliana ^[2]; Haugen, Gregory ^[2]; Atanasoski, Radoslav ^[2]

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1. ORNL
2. 3M Industrial Mineral Products

The stability of Ru0.1Ir0.9 oxidation evolution reaction (OER) catalysts deposited on Pt-coated nanostructured thin films (NSTFs) has been investigated by aberration-corrected electron microscopy. Accelerated stress tests showed that the OER catalysts significantly improved the durability of the Pt under cell reversal conditions. High-resolution images of the end-of-life NSTFs showed significant Ir loss from the whisker surfaces, while no Pt loss was observed, indicating that the OER catalysts had protected the catalyst coated whisker surfaces from degradation.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Shared Research Equipment Collaborative Research Center
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1029213
• Resource Relation: Conference: 220th ECS Meeting and Electrochemical Energy Summit, Boston, MA, USA, 20111009, 20111014
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CATALYSTS
COATINGS
DEPOSITION
ELECTRON MICROSCOPY
IRIDIUM
NANOSTRUCTURES
OXIDATION
PLATINUM
RUTHENIUM
STABILITY
THIN FILMS
TRANSIENTS