Joint spatio-spectral based edge detection for multispectral infrared imagery.
- University of New Mexico, Albuquerque, NM
- Los Alamos National Laboratory, Los Alamos, NM
Image segmentation is one of the most important and difficult tasks in digital image processing. It represents a key stage of automated image analysis and interpretation. Segmentation algorithms for gray-scale images utilize basic properties of intensity values such as discontinuity and similarity. However, it is possible to enhance edge-detection capability by means of using spectral information provided by multispectral (MS) or hyperspectral (HS) imagery. In this paper we consider image segmentation algorithms for multispectral images with particular emphasis on detection of multi-color or multispectral edges. More specifically, we report on an algorithm for joint spatio-spectral (JSS) edge detection. By joint we mean simultaneous utilization of spatial and spectral characteristics of a given MS or HS image. The JSS-based edge-detection approach, termed Spectral Ratio Contrast (SRC) edge-detection algorithm, utilizes the novel concept of matching edge signatures. The edge signature represents a combination of spectral ratios calculated using bands that enhance the spectral contrast between the two materials. In conjunction with a spatial mask, the edge signature give rise to a multispectral operator that can be viewed as a three-dimensional extension of the mask. In the extended mask, the third (spectral) dimension of each hyper-pixel can be chosen independently. The SRC is verified using MS and HS imagery from a quantum-dot in a well infrared (IR) focal plane array, and the Airborne Hyperspectral Imager.
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1021150
- Report Number(s):
- SAND2010-4250C; TRN: US201116%%1063
- Resource Relation:
- Conference: Proposed for presentation at the IGARSS 2010 Conference held June 25-30, 2011 in Honolulu, HI.
- Country of Publication:
- United States
- Language:
- English
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