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Title: Nanofabrication of SERS device by an integrated block-copolymer and nanoimprint lithography method.

Conference ·
OSTI ID:1016999

The integration of block-copolymers (BCPs) and nanoimprint lithography (NIL) presents a novel and cost-effective approach to achieving nanoscale patterning capabilities. The authors demonstrate the fabrication of a surface-enhanced Raman scattering device using templates created by the BCP-NIL integrated method. The method utilizes a poly(styrene-block-methyl methacrylate) cylindrical-forming diblock-copolymer as a masking material to create a Si template, which is then used to perform a thermal imprint of a poly(methyl methacrylate) (PMMA) layer on a Si substrate. Au with a Cr adhesion layer was evaporated onto the patterned PMMA and the subsequent lift-off resulted in an array of nanodots. Raman spectra collected for samples of R6G on Si substrates with and without patterned nanodots showed enhancement of peak intensities due to the presence of the nanodot array. The demonstrated BCP-NIL fabrication method shows promise for cost-effective nanoscale fabrication of plasmonic and nanoelectronic devices.

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1016999
Report Number(s):
SAND2010-3024C; TRN: US201113%%243
Resource Relation:
Conference: Proposed for presentation at the Electron, Ion, and Photon Beam Technology and Nanofabrication held June 1-4, 2010 in Anchorage, AK.
Country of Publication:
United States
Language:
English