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Title: Optical XAFS of ZnO Nanowires at the Zn K-Edge and Related Phenomena

We report x-ray excited optical luminescence (XEOL) from one-dimensional nanostructures of ZnO excited with photon energies across the Zn K-edge. The optical luminescence shows an UV and a green emission band characteristic of near band edge and defect emission, respectively. The optical channels were used in turn to monitor the Zn K-edge XAFS to high k values. The densities of states of oxygen character in the valence band were also studied with x-ray emission spectroscopy (XES). The Zn K-edge decay dynamics was examined with time-resolved x-ray excited optical luminescence.
Authors:
; ; ; ; ; ; ; ; ; ;  [1] ;  [2] ;  [2] ;  [2]
  1. (APS)
  2. (
Publication Date:
OSTI Identifier:
1009007
Resource Type:
Conference
Resource Relation:
Conference: 13th International Conference on X-ray Absorption Fine Structure-XAFS13;9-14 July 2006;Stanford, California, USA
Publisher:
AIP Conference Proceedings;B. Hedman, P. Pianetta, eds.;American Institute of Physics;734-736
Research Org:
Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
ENGLISH
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; 77 NANOSCIENCE AND NANOTECHNOLOGY; ABSORPTION; DECAY; DEFECTS; EMISSION SPECTROSCOPY; LUMINESCENCE; MONITORS; NANOSTRUCTURES; OXYGEN; PHOTONS; VALENCE