Thoughts on Prospects for New Characterization Tools
Book
·
OSTI ID:1006332
One of the key challenges for many imaging characterization methods is in preparing samples. For instance, TEM sample preparation for complex structures or soft materials is currently time consuming and expensive. Improving the throughput and decreasing the cost of key technologies such as focused ion beam (FIB) and cryo-ultramicrotoming sample preparation would aid in accelerating nanoscale research in soft materials, complex structures and at the intersection of biology and nanotechnology.
- Research Organization:
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Environmental Molecular Sciences Lab. (EMSL)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-76RL01830
- OSTI ID:
- 1006332
- Report Number(s):
- PNNL-SA-57250; 2573a; KC0303020; TRN: US201105%%934
- Resource Relation:
- Related Information: Productive Nanosystems; a Technology Roadmap: Part 3 Proceedings of the Roadmap Working Group
- Country of Publication:
- United States
- Language:
- English
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