In Situ Electric-Field-Induced Contrast Imaging of Electronic Transport Pathways in Nanotube-Polymer Composites

Journal Article · Sun Jan 01 00:00:00 EST 2006 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2220058· OSTI ID:1003605

Jesse, Stephen ^[1]; Guillorn, Michael A ^[1]; Ivanov, Ilia N ^[1]; Puretzky, Alexander A ^[1]; Howe, Jane Y ^[1]; Britt, Phillip F ^[1]; Geohegan, David B ^[1]

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1. ORNL

An electric-field-induced contrast mechanism for scanning electron microscopy is reported which permits the visualization of embedded nanomaterials inside various matrices with high contrast and high definition. The high contrast is proposed to result from localized enhancement of secondary electron emission from the nanomaterials due to electric-field-induced changes in their work functions. By utilizing a stage that allows in situ current-voltage measurements inside a scanning electron microscope, single-walled carbon nanotubes embedded within polymethyl methacrylate films were visualized directly. In addition to the rapid assessment of nanotube dispersion within polymers, electric-field-induced contrast imaging enables the determination of percolation pathways. From the contrast in the images, the relative voltage at all points in the electron micrograph can be determined, providing a new mechanism to understand electronic percolation through nanoscale networks.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Laboratory Directed Research and Development (LDRD) Program
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1003605
• Journal Information: Applied Physics Letters, Vol. 89, Issue 1; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
CARBON
ELECTRON EMISSION
ELECTRON MICROSCOPES
ELECTRONS
MATRICES
METHACRYLATES
NANOTUBES
POLYMERS
SCANNING ELECTRON MICROSCOPY
TRANSPORT
WORK FUNCTIONS