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Title: Screen charge transfer by grounded tip on ferroelectric surfaces.

Abstract

We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC); Samsung Electronics
OSTI Identifier:
1002233
Report Number(s):
ANL/MSD/JA-68850
Journal ID: 1862-6254; TRN: US201102%%669
DOE Contract Number:  
DE-AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Phys. Status Solidi RRL
Additional Journal Information:
Journal Volume: 2; Journal Issue: 2 ; Mar. 2008
Country of Publication:
United States
Language:
ENGLISH
Subject:
36 MATERIALS SCIENCE; FERROELECTRIC MATERIALS; POLARIZATION; CHARGE TRANSPORT; THIN FILMS

Citation Formats

Kim, Y, Kim, J, Buhlmann, S, Hong, S, Kim, Y K, Kim, S -H, No, K, Materials Science Division, Korea Advanced Inst. of Science and Technology, Samsung Advanced Inst. of Technology, and Inostek Inc. Screen charge transfer by grounded tip on ferroelectric surfaces.. United States: N. p., 2008. Web. doi:10.1002/pssr.200701265.
Kim, Y, Kim, J, Buhlmann, S, Hong, S, Kim, Y K, Kim, S -H, No, K, Materials Science Division, Korea Advanced Inst. of Science and Technology, Samsung Advanced Inst. of Technology, & Inostek Inc. Screen charge transfer by grounded tip on ferroelectric surfaces.. United States. https://doi.org/10.1002/pssr.200701265
Kim, Y, Kim, J, Buhlmann, S, Hong, S, Kim, Y K, Kim, S -H, No, K, Materials Science Division, Korea Advanced Inst. of Science and Technology, Samsung Advanced Inst. of Technology, and Inostek Inc. 2008. "Screen charge transfer by grounded tip on ferroelectric surfaces.". United States. https://doi.org/10.1002/pssr.200701265.
@article{osti_1002233,
title = {Screen charge transfer by grounded tip on ferroelectric surfaces.},
author = {Kim, Y and Kim, J and Buhlmann, S and Hong, S and Kim, Y K and Kim, S -H and No, K and Materials Science Division and Korea Advanced Inst. of Science and Technology and Samsung Advanced Inst. of Technology and Inostek Inc.},
abstractNote = {We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage.},
doi = {10.1002/pssr.200701265},
url = {https://www.osti.gov/biblio/1002233}, journal = {Phys. Status Solidi RRL},
number = 2 ; Mar. 2008,
volume = 2,
place = {United States},
year = {Sat Mar 01 00:00:00 EST 2008},
month = {Sat Mar 01 00:00:00 EST 2008}
}