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Title: X-ray Imaging Based on Compton Scattering

This presentation highlights a number of applications where rapid, low-dose, one-sided Compton imaging is especially desirable and describes typical methods for creating these images. Some of the systmore »ems are also capable of scanning an object by simultaneously forming multiple backscatter images of vehicles from different perspectives, such as left, right, and top-down. While each view has limited penetration ability, the combination of views provides a powerful inspection tool that often permits threat objects to be easily discerned, even in a cluttered environment.« less
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Title: X-ray Imaging Based on Compton Scattering
Authors:
Publication Date: 2011-08-10
OSTI Identifier: 1042460
DOE Contract Number: DE-ACO2-06CH11357
Resource Type: Multimedia
Resource Relation: Conference: APS Colloquium Series, Advanced Photon Source (APS) at Argonne National Laboratory, Argonne, Illinois (United States), presented on August 10, 2011
Research Org: ANL (Argonne National Laboratory (ANL), Argonne, IL (United States))
Sponsoring Org: USDOE Office of Science (SC)
Subject: 47 OTHER INSTRUMENTATION ; ANTIFERROMAGNETIC MATERIALS ; CHARGE CARRIERS ; CHARGE DENSITY ; COPPER COMPOUNDS ; COPPER IONS ; CUPRATES ; DIFFRACTION ; DOMAIN STRUCTURE ; DOPED MATERIALS ; ELECTRONIC STRUCTURE ; LAYERS ; KINETIC ENERGY ; OXIDES ; SEGREGATION ; SPIN ; SUPERCONDUCTIVITY ; HIGH-TC SUPERCONDUCTORS ; X-ray ; Compton Scattering ; Advanced Photon Source
Country of Publication: United States
Language: English
Run Time: 0:53:18
System Entry Date: 2016-01-28