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Title: Microscopy with Slow Electrons: From LEEM to XPEEM

The short penetration and escape depth of electrons with energies below 1 keV make them ideally suited for the study of surfaces and ultrathin films. The combination of the low energy electrons and tmore »he high lateral resolution of a microscope produces a powerful method for the characterization of nanostructures on bulk samples, in particular if the microscope is equipped with an imaging energy filter and connected to a synchrotron radiation source. Comprehensive characterization by imaging, diffraction, and spectroscope of the structural, chemical, and magnetic properties is then possible. The Talk will describe the various imaging techniques in using reflected and emitted electrons in low-energy electron microscopy (LEEM) and x-ray photoemission electron microscopy (XPEEM), with an emphasis on magnetic materials with spin-polarized LEEM and x-ray magnetic circular dichroism PEEM. The talk with end with an outlook on future possibilities.« less
Title: Microscopy with Slow Electrons: From LEEM to XPEEM
Publication Date: 2004-09-08
OSTI Identifier: 1007913
DOE Contract Number: ACO2-06CH11357
Resource Type: Multimedia
Resource Relation: Conference: APS Colloquium Series, Advanced Photon Source (APS) at Argonne National Laboratory, Argonne, Illinois (United States), presented on September 08, 2004
Research Org: ANL (Argonne National Laboratory (ANL), Argonne, IL (United States))
Sponsoring Org: USDOE Office of Science (SC)
Country of Publication: United States
Language: English
Run Time:
System Entry Date: 2014-06-26