Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base
Abstract
Modern inelastic X-ray spectrometers employ curved, bent and diced analyzers to capture sufficiently large solid angles of radially emitted scattered radiation emanating from the sample. Fabricating these intricate analyzers, especially when a high energy resolution of a few millielectronvolts is required, is very time-consuming, expensive and often a hit-or-miss affair. A novel fabrication technique is introduced, utilizing a concave-spherical, microporous aluminium base to hold an assembly of a thin glass substrate with a diced crystal wafer bonded to it. Under uniform vacuum forces, the glass substrate is drawn into the aluminium base, achieving the desired bending radius, while dicing of the diffracting crystal layer prevents bending strain from being imposed on the individual crystal pixels. This technique eliminates the need for permanently bonding the crystal assembly to the concave lens, offering the opportunity for correcting figure errors, avoiding long-term degradation of the permanent bond, and making both lens and crystal reusable. Process and material costs are thus substantially decreased. Two analyzers, Si(844) and Ge(337) with intrinsic resolutions of 14.6 meV and 36.5 meV, respectively, were produced in this fashion and characterized in resonant inelastic X-ray scattering (RIXS) measurements. The achieved overall energy resolutions for both analyzers were 29.4 meV formore »
- Authors:
-
[1];
- Argonne National Laboratory (ANL), Lemont, IL (United States). Advanced Photon Source (APS)
- Publication Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1899293
- Grant/Contract Number:
- AC02-06CH11357
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Synchrotron Radiation (Online)
- Additional Journal Information:
- Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 29; Journal Issue: 3; Journal ID: ISSN 1600-5775
- Publisher:
- International Union of Crystallography
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 73 NUCLEAR PHYSICS AND RADIATION PHYSICS; spherical crystal analyzers; micro-porous aluminium; inelastic X-ray scattering
Citation Formats
Said, Ayman H., Kim, Jung Ho, Aran, Emily K., and Gog, Thomas. Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base. United States: N. p., 2022.
Web. doi:10.1107/s1600577522001886.
Said, Ayman H., Kim, Jung Ho, Aran, Emily K., & Gog, Thomas. Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base. United States. https://doi.org/10.1107/s1600577522001886
Said, Ayman H., Kim, Jung Ho, Aran, Emily K., and Gog, Thomas. Fri .
"Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base". United States. https://doi.org/10.1107/s1600577522001886. https://www.osti.gov/servlets/purl/1899293.
@article{osti_1899293,
title = {Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base},
author = {Said, Ayman H. and Kim, Jung Ho and Aran, Emily K. and Gog, Thomas},
abstractNote = {Modern inelastic X-ray spectrometers employ curved, bent and diced analyzers to capture sufficiently large solid angles of radially emitted scattered radiation emanating from the sample. Fabricating these intricate analyzers, especially when a high energy resolution of a few millielectronvolts is required, is very time-consuming, expensive and often a hit-or-miss affair. A novel fabrication technique is introduced, utilizing a concave-spherical, microporous aluminium base to hold an assembly of a thin glass substrate with a diced crystal wafer bonded to it. Under uniform vacuum forces, the glass substrate is drawn into the aluminium base, achieving the desired bending radius, while dicing of the diffracting crystal layer prevents bending strain from being imposed on the individual crystal pixels. This technique eliminates the need for permanently bonding the crystal assembly to the concave lens, offering the opportunity for correcting figure errors, avoiding long-term degradation of the permanent bond, and making both lens and crystal reusable. Process and material costs are thus substantially decreased. Two analyzers, Si(844) and Ge(337) with intrinsic resolutions of 14.6 meV and 36.5 meV, respectively, were produced in this fashion and characterized in resonant inelastic X-ray scattering (RIXS) measurements. The achieved overall energy resolutions for both analyzers were 29.4 meV for Si(844) and 56.6 meV for Ge(337). Although the RIXS technique is veru sensitive to analyzer imperfections, the analyzers were found to be equal, if not superior, in quality to their traditional, permanently bonded counterparts.},
doi = {10.1107/s1600577522001886},
journal = {Journal of Synchrotron Radiation (Online)},
number = 3,
volume = 29,
place = {United States},
year = {Fri Apr 01 00:00:00 EDT 2022},
month = {Fri Apr 01 00:00:00 EDT 2022}
}
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