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Title: Simulations of radiation damage as a function of the temporal pulse profile in femtosecond X-ray protein crystallography

Abstract

Serial femtosecond X-ray crystallography of protein nanocrystals using ultrashort and intense pulses from an X-ray free-electron laser has proved to be a successful method for structural determination. However, due to significant variations in diffraction pattern quality from pulse to pulse only a fraction of the collected frames can be used. Experimentally, the X-ray temporal pulse profile is not known and can vary with every shot. This simulation study describes how the pulse shape affects the damage dynamics, which ultimately affects the biological interpretation of electron density. The instantaneously detected signal varies during the pulse exposure due to the pulse properties, as well as the structural and electronic changes in the sample. Here ionization and atomic motion are simulated using a radiation transfer plasma code. Pulses with parameters typical for X-ray free-electron lasers are considered: pulse energies ranging from 104to 107 J cm-2with photon energies from 2 to 12 keV, up to 100 fs long. Radiation damage in the form of sample heating that will lead to a loss of crystalline periodicity and changes in scattering factor due to electronic reconfigurations of ionized atoms are considered here. The simulations show differences in the dynamics of the radiation damage processes for differentmore » temporal pulse profiles and intensities, where ionization or atomic motion could be predominant. Overall, the different dynamics influence the recorded diffracted signal in any given resolution and will affect the subsequent structure determination.« less

Authors:
 [1];  [1];  [1];  [2];  [3]
  1. Uppsala Univ. (Sweden)
  2. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  3. Uppsala Univ. (Sweden); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science
Publication Date:
Research Org.:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1810658
Report Number(s):
LLNL-JRNL-819977
Journal ID: ISSN 1600-5775; 1029489; TRN: US2213068
Grant/Contract Number:  
AC52-07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 22; Journal Issue: 2; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS; x-ray free-electron laser; serial femtosecond crystallography; radiation damage; plasma simulations

Citation Formats

Jönsson, H. Olof, Tîmneanu, Nicuşor, Östlin, Christofer, Scott, Howard A., and Caleman, Carl. Simulations of radiation damage as a function of the temporal pulse profile in femtosecond X-ray protein crystallography. United States: N. p., 2015. Web. doi:10.1107/s1600577515002878.
Jönsson, H. Olof, Tîmneanu, Nicuşor, Östlin, Christofer, Scott, Howard A., & Caleman, Carl. Simulations of radiation damage as a function of the temporal pulse profile in femtosecond X-ray protein crystallography. United States. https://doi.org/10.1107/s1600577515002878
Jönsson, H. Olof, Tîmneanu, Nicuşor, Östlin, Christofer, Scott, Howard A., and Caleman, Carl. Wed . "Simulations of radiation damage as a function of the temporal pulse profile in femtosecond X-ray protein crystallography". United States. https://doi.org/10.1107/s1600577515002878. https://www.osti.gov/servlets/purl/1810658.
@article{osti_1810658,
title = {Simulations of radiation damage as a function of the temporal pulse profile in femtosecond X-ray protein crystallography},
author = {Jönsson, H. Olof and Tîmneanu, Nicuşor and Östlin, Christofer and Scott, Howard A. and Caleman, Carl},
abstractNote = {Serial femtosecond X-ray crystallography of protein nanocrystals using ultrashort and intense pulses from an X-ray free-electron laser has proved to be a successful method for structural determination. However, due to significant variations in diffraction pattern quality from pulse to pulse only a fraction of the collected frames can be used. Experimentally, the X-ray temporal pulse profile is not known and can vary with every shot. This simulation study describes how the pulse shape affects the damage dynamics, which ultimately affects the biological interpretation of electron density. The instantaneously detected signal varies during the pulse exposure due to the pulse properties, as well as the structural and electronic changes in the sample. Here ionization and atomic motion are simulated using a radiation transfer plasma code. Pulses with parameters typical for X-ray free-electron lasers are considered: pulse energies ranging from 104to 107 J cm-2with photon energies from 2 to 12 keV, up to 100 fs long. Radiation damage in the form of sample heating that will lead to a loss of crystalline periodicity and changes in scattering factor due to electronic reconfigurations of ionized atoms are considered here. The simulations show differences in the dynamics of the radiation damage processes for different temporal pulse profiles and intensities, where ionization or atomic motion could be predominant. Overall, the different dynamics influence the recorded diffracted signal in any given resolution and will affect the subsequent structure determination.},
doi = {10.1107/s1600577515002878},
journal = {Journal of Synchrotron Radiation (Online)},
number = 2,
volume = 22,
place = {United States},
year = {Wed Feb 25 00:00:00 EST 2015},
month = {Wed Feb 25 00:00:00 EST 2015}
}

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