Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II
Abstract
Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS-II). The characterization includes point-to-point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). Here, the synchrotron X-ray test of the mirror was carried out reversely as a focusing device. The results show that the L-shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS-II.
- Authors:
-
[1];
[2]
- Brookhaven National Lab. (BNL), Upton, NY (United States); Univ. Federal de Goias, Campus Jatai (Brazil)
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Publication Date:
- Research Org.:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1768779
- Report Number(s):
- BNL-221107-2021-JAAM
Journal ID: ISSN 0909-0495
- Grant/Contract Number:
- SC0012704; AC02-98CH10886
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Synchrotron Radiation
- Additional Journal Information:
- Journal Volume: 18; Journal Issue: 6; Journal ID: ISSN 0909-0495
- Publisher:
- International Union of Crystallography
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; X-ray optics; X-ray mirrors; L-shaped mirror; nested mirror; Montel optics; Kirkpatrick Baez geometry
Citation Formats
Honnicke, Marcelo G., Keister, Jeffrey W., Conley, Raymond, Kaznatcheev, Konstantine, Takacs, Peter Z., Coburn, David Scott, Reffi, Leo, and Cai, Yong Q. Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II. United States: N. p., 2011.
Web. doi:10.1107/s0909049511031098.
Honnicke, Marcelo G., Keister, Jeffrey W., Conley, Raymond, Kaznatcheev, Konstantine, Takacs, Peter Z., Coburn, David Scott, Reffi, Leo, & Cai, Yong Q. Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II. United States. https://doi.org/10.1107/s0909049511031098
Honnicke, Marcelo G., Keister, Jeffrey W., Conley, Raymond, Kaznatcheev, Konstantine, Takacs, Peter Z., Coburn, David Scott, Reffi, Leo, and Cai, Yong Q. Fri .
"Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II". United States. https://doi.org/10.1107/s0909049511031098. https://www.osti.gov/servlets/purl/1768779.
@article{osti_1768779,
title = {Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II},
author = {Honnicke, Marcelo G. and Keister, Jeffrey W. and Conley, Raymond and Kaznatcheev, Konstantine and Takacs, Peter Z. and Coburn, David Scott and Reffi, Leo and Cai, Yong Q.},
abstractNote = {Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS-II). The characterization includes point-to-point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). Here, the synchrotron X-ray test of the mirror was carried out reversely as a focusing device. The results show that the L-shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS-II.},
doi = {10.1107/s0909049511031098},
journal = {Journal of Synchrotron Radiation},
number = 6,
volume = 18,
place = {United States},
year = {Fri Sep 16 00:00:00 EDT 2011},
month = {Fri Sep 16 00:00:00 EDT 2011}
}
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Works referenced in this record:
A focusing multilayer analyser for local diffraction studies
journal, September 1999
- Lienert, U.; Poulsen, H. F.; Honkimäki, V.
- Journal of Synchrotron Radiation, Vol. 6, Issue 5
Parallel-beam coupling into channel-cut monochromators using curved graded multilayers
journal, April 1995
- Schuster, M.; Gobel, H.
- Journal of Physics D: Applied Physics, Vol. 28, Issue 4A
SHADOW: A synchrotron radiation ray tracing program
journal, May 1986
- Lai, B.; Cerrina, F.
- Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 246, Issue 1-3
X-Ray Bragg Diffraction in Asymmetric Backscattering Geometry
journal, December 2006
- Shvyd’ko, Yu.; Lerche, M.; Kuetgens, U.
- Physical Review Letters, Vol. 97, Issue 23
An X‐Ray Method of Determining Rates of Diffusion in the Solid State
journal, May 1940
- DuMond, Jesse; Youtz, J. Paul
- Journal of Applied Physics, Vol. 11, Issue 5
State-of-the-art of Multilayer Optics for Laboratory X-ray Devices
journal, December 2005
- Hertlein, Frank; Oehr, Alexandra; Hoffmann, Christian
- Particle & Particle Systems Characterization, Vol. 22, Issue 6
Development and realization of non-periodic W/Si multilayer mirrors for 5–14keV X-ray plasma diagnostic
journal, November 2007
- Champeaux, J. -Ph.; Troussel, Ph.; Villier, B.
- Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 581, Issue 3
Tracing X-rays through an L-shaped laterally graded multilayer mirror: a synchrotron application
journal, March 2010
- Honnicke, Marcelo Goncalves; Huang, Xianrong; Keister, Jeffrey W.
- Journal of Synchrotron Radiation, Vol. 17, Issue 3
Design challenges and performance of nested neutron mirrors for microfocusing on SNAP
journal, October 2009
- Ice, Gene E.; Pang, Judy W. L.; Tulk, Chris
- Journal of Applied Crystallography, Vol. 42, Issue 6
Detection of the standing X-ray wavefield intensity inside a thin crystal using back-diffraction topography and imaging
journal, October 2009
- Honnicke, Marcelo Goncalves; Cusatis, Cesar
- Journal of Applied Crystallography, Vol. 42, Issue 6
Characterization and comparison of X-ray focusing optics for ultrafast X-ray diffraction experiments
journal, August 2008
- Shymanovich, U.; Nicoul, M.; Sokolowski-Tinten, K.
- Applied Physics B, Vol. 92, Issue 4
Formation of Optical Images by X-Rays
journal, January 1948
- Kirkpatrick, Paul; Baez, A. V.
- Journal of the Optical Society of America, Vol. 38, Issue 9
Achromatic nested Kirkpatrick–Baez mirror optics for hard X-ray nanofocusing
journal, May 2011
- Liu, Wenjun; Ice, Gene E.; Assoufid, Lahsen
- Journal of Synchrotron Radiation, Vol. 18, Issue 4
Works referencing / citing this record:
The Ultrahigh Resolution IXS Beamline of NSLS-II: Recent Advances and Scientific Opportunities
journal, March 2013
- Cai, Yong Q.; Coburn, D. S.; Cunsolo, A.
- Journal of Physics: Conference Series, Vol. 425, Issue 20
Advances in high-resolution RIXS for the study of excitation spectra under high pressure
journal, July 2016
- Kim, Jungho
- High Pressure Research, Vol. 36, Issue 3
Magnetic Circular Dichroism in X-Ray Emission from Ferromagnets
journal, September 2017
- Inami, Toshiya
- Physical Review Letters, Vol. 119, Issue 13