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Title: Characterizing TES power noise for future single optical-phonon and infrared-photon detectors

Abstract

In this letter, we present the performance of a $$100~\mu\mathrm{m}\times 400~\mu\mathrm{m} \times 40~\mathrm{nm}$$ tungsten (W) Transition-Edge Sensor (TES) with a critical temperature of 40 mK. This device has a measured noise equivalent power (NEP) of $$1.5\times 10^{-18}\ \mathrm{W}/\sqrt{\mathrm{Hz}}$$, in a bandwidth of $2.6$ kHz, indicating a resolution for Dirac delta energy depositions of $$40\pm 5~\mathrm{meV}$$ (rms). The performance demonstrated by this device is a critical step towards developing a $$\mathcal{O}(100)~\mathrm{meV}$$ threshold athermal phonon detectors for low-mass dark matter searches.

Authors:
ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [2];  [2];  [1];  [3]; ORCiD logo [3]; ORCiD logo [4];  [5];  [5];  [1]; ORCiD logo [2];  [5];  [1];  [1];  [1];  [1]
+ Show Author Affiliations
  1. Univ. of California, Berkeley, CA (United States)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States); Kavli Inst. for Particle Astrophysics and Cosmology, Menlo Park, CA (United States)
  3. Univ. of Colorado, Denver, CO (United States)
  4. Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States); Univ. of Chicago, IL (United States)
  5. Texas A & M Univ., College Station, TX (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), High Energy Physics (HEP); National Science Foundation (NSF); Michael M. Garland
OSTI Identifier:
1647078
Alternate Identifier(s):
OSTI ID: 1647687
Report Number(s):
arXiv:2004.10257; FERMILAB-PUB-20-390-AE
Journal ID: ISSN 2158-3226; oai:inspirehep.net:1792177; TRN: US2202573
Grant/Contract Number:  
AC02-07CH11359; KA-2401032; SC0018981; SC0017859; AC02-76SF00515; PHY-1415388; PHY-1809769
Resource Type:
Accepted Manuscript
Journal Name:
AIP Advances
Additional Journal Information:
Journal Volume: 10; Journal Issue: 8; Journal ID: ISSN 2158-3226
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Environmental noise; Detectors; Electronic noise; Superconducting films; Thermal fluctuations; Phonons; I-V characteristics; Sensors; Signal processing; Dark matter

Citation Formats

Fink, C. W., Watkins, S. L., Aramaki, T., Brink, P. L., Ganjam, S., Hines, B. A., Huber, M. E., Kurinsky, N. A., Mahapatra, R., Mirabolfathi, N., Page, W. A., Partridge, R., Platt, M., Pyle, M., Sadoulet, B., Serfass, B., and Zuber, S. Characterizing TES power noise for future single optical-phonon and infrared-photon detectors. United States: N. p., 2020. Web. doi:10.1063/5.0011130.
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Fink, C. W., Watkins, S. L., Aramaki, T., Brink, P. L., Ganjam, S., Hines, B. A., Huber, M. E., Kurinsky, N. A., Mahapatra, R., Mirabolfathi, N., Page, W. A., Partridge, R., Platt, M., Pyle, M., Sadoulet, B., Serfass, B., & Zuber, S. Characterizing TES power noise for future single optical-phonon and infrared-photon detectors. United States. https://doi.org/10.1063/5.0011130
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Fink, C. W., Watkins, S. L., Aramaki, T., Brink, P. L., Ganjam, S., Hines, B. A., Huber, M. E., Kurinsky, N. A., Mahapatra, R., Mirabolfathi, N., Page, W. A., Partridge, R., Platt, M., Pyle, M., Sadoulet, B., Serfass, B., and Zuber, S. Mon . "Characterizing TES power noise for future single optical-phonon and infrared-photon detectors". United States. https://doi.org/10.1063/5.0011130. https://www.osti.gov/servlets/purl/1647078.
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@article{osti_1647078,
title = {Characterizing TES power noise for future single optical-phonon and infrared-photon detectors},
author = {Fink, C. W. and Watkins, S. L. and Aramaki, T. and Brink, P. L. and Ganjam, S. and Hines, B. A. and Huber, M. E. and Kurinsky, N. A. and Mahapatra, R. and Mirabolfathi, N. and Page, W. A. and Partridge, R. and Platt, M. and Pyle, M. and Sadoulet, B. and Serfass, B. and Zuber, S.},
abstractNote = {In this letter, we present the performance of a $100~\mu\mathrm{m}\times 400~\mu\mathrm{m} \times 40~\mathrm{nm}$ tungsten (W) Transition-Edge Sensor (TES) with a critical temperature of 40 mK. This device has a measured noise equivalent power (NEP) of $1.5\times 10^{-18}\ \mathrm{W}/\sqrt{\mathrm{Hz}}$, in a bandwidth of $2.6$ kHz, indicating a resolution for Dirac delta energy depositions of $40\pm 5~\mathrm{meV}$ (rms). The performance demonstrated by this device is a critical step towards developing a $\mathcal{O}(100)~\mathrm{meV}$ threshold athermal phonon detectors for low-mass dark matter searches.},
doi = {10.1063/5.0011130},
journal = {AIP Advances},
number = 8,
volume = 10,
place = {United States},
year = {Mon Aug 17 00:00:00 EDT 2020},
month = {Mon Aug 17 00:00:00 EDT 2020}
}
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https://doi.org/10.1063/5.0011130
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Cited by: 13 works
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Figures / Tables:

FIG. 1 FIG. 1: Left: TES mask design. The W is shown in red, while the blue represents Al bias rails. The Al connects to the left and right sides of the TES. Middle: Thermal model for experimental setup. For simplicity, only two TESs are shown in the model. Right: Electrical circuit.more » Rsh is a shunt resistor which turns the current source (IBias) into a voltage bias. Any parasitic resistance on the shunt side of the bias circuit is absorbed into the value used for Rsh in this analysis. Rp is the parasitic resistance on the TES side of the bias circuit. L is the inductance in the TES line. RTES is the TES resistance, which takes on a value of R0 when in transition and takes on a value of RN when its temperature is above Tc.« less
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