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Title: (Invited) Investigation of the Si/TiO2/Electrolyte Interface Using Operando Tender X-ray Photoelectron Spectroscopy

Abstract

Semiconductor-electrolyte interfaces provide for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate in our research that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.

Authors:
 [1];  [1];  [1];  [2];  [3];  [2];  [2];  [3];  [4];  [5];  [1];  [1];  [6]
  1. California Institute of Technology (CalTech), Pasadena, CA (United States). Joint Center for Artificial Photosynthesis (JCAP)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  4. Technische Univ. Darmstadt (Germany)
  5. California Institute of Technology (CalTech), Pasadena, CA (United States)
  6. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Chinese Academy of Sciences (CAS), Shanghai (China). Shanghai Inst. of Microsystem
Publication Date:
Research Org.:
California Institute of Technology (CalTech), Pasadena, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1634113
Grant/Contract Number:  
SC0004993; AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
ECS Transactions (Online)
Additional Journal Information:
Journal Name: ECS Transactions (Online); Journal Volume: 66; Journal Issue: 6; Journal ID: ISSN 1938-6737
Publisher:
Electrochemical Society
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Lichterman, M. F., Richter, M. H., Hu, S., Crumlin, E. J., Axnanda, S., Favaro, M., Drisdell, W., Hussain, Z., Mayer, T., Brunschwig, B., Lewis, Nathan S., Lewerenz, H. J., and Liu, Z. (Invited) Investigation of the Si/TiO2/Electrolyte Interface Using Operando Tender X-ray Photoelectron Spectroscopy. United States: N. p., 2015. Web. doi:10.1149/06606.0097ecst.
Lichterman, M. F., Richter, M. H., Hu, S., Crumlin, E. J., Axnanda, S., Favaro, M., Drisdell, W., Hussain, Z., Mayer, T., Brunschwig, B., Lewis, Nathan S., Lewerenz, H. J., & Liu, Z. (Invited) Investigation of the Si/TiO2/Electrolyte Interface Using Operando Tender X-ray Photoelectron Spectroscopy. United States. https://doi.org/10.1149/06606.0097ecst
Lichterman, M. F., Richter, M. H., Hu, S., Crumlin, E. J., Axnanda, S., Favaro, M., Drisdell, W., Hussain, Z., Mayer, T., Brunschwig, B., Lewis, Nathan S., Lewerenz, H. J., and Liu, Z. Mon . "(Invited) Investigation of the Si/TiO2/Electrolyte Interface Using Operando Tender X-ray Photoelectron Spectroscopy". United States. https://doi.org/10.1149/06606.0097ecst. https://www.osti.gov/servlets/purl/1634113.
@article{osti_1634113,
title = {(Invited) Investigation of the Si/TiO2/Electrolyte Interface Using Operando Tender X-ray Photoelectron Spectroscopy},
author = {Lichterman, M. F. and Richter, M. H. and Hu, S. and Crumlin, E. J. and Axnanda, S. and Favaro, M. and Drisdell, W. and Hussain, Z. and Mayer, T. and Brunschwig, B. and Lewis, Nathan S. and Lewerenz, H. J. and Liu, Z.},
abstractNote = {Semiconductor-electrolyte interfaces provide for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate in our research that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.},
doi = {10.1149/06606.0097ecst},
journal = {ECS Transactions (Online)},
number = 6,
volume = 66,
place = {United States},
year = {Mon Apr 13 00:00:00 EDT 2015},
month = {Mon Apr 13 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Figures / Tables:

Figure 1 Figure 1: Schematic of the layer stack investigated by operando XPS. The thicknesses of the various layers are not drawn to scale (see text). On bare electrodes, no nickel was present between the ALD TiO2 and the electrolyte.

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Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.