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Title: Nanoscale transient gratings excited and probed by extreme ultraviolet femtosecond pulses

Abstract

Advances in developing ultrafast coherent sources operating at extreme ultraviolet (EUV) and x-ray wavelengths allow the extension of nonlinear optical techniques to shorter wavelengths. Here, we describe EUV transient grating spectroscopy, in which two crossed femtosecond EUV pulses produce spatially periodic nanoscale excitations in the sample and their dynamics is probed via diffraction of a third time-delayed EUV pulse. The use of radiation with wavelengths down to 13.3 nm allowed us to produce transient gratings with periods as short as 28 nm and observe thermal and coherent phonon dynamics in crystalline silicon and amorphous silicon nitride. This approach allows measurements of thermal transport on the ~10-nm scale, where the two samples show different heat transport regimes, and can be applied to study other phenomena showing nontrivial behaviors at the nanoscale, such as structural relaxations in complex liquids and ultrafast magnetic dynamics.

Authors:
ORCiD logo [1];  [1];  [1]; ORCiD logo [1]; ORCiD logo [1];  [2]; ORCiD logo [1];  [1];  [3];  [2]; ORCiD logo [4]; ORCiD logo [3];  [2]; ORCiD logo [5];  [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [5];  [5] more »;  [1]; ORCiD logo [6];  [1];  [3];  [5]; ORCiD logo [1];  [1]; ORCiD logo [1];  [1];  [1]; ORCiD logo [6]; ORCiD logo [2]; ORCiD logo [3]; ORCiD logo [2]; ORCiD logo [1] « less
+ Show Author Affiliations
  1. Elettra Sincrotrone Trieste (Italy)
  2. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
  3. Univ. of Trento (Italy)
  4. National Research Council (CNR), Trieste (Italy). Istituto Officina dei Materiali (IOM)
  5. Univ. of Colorado, Boulder, CO (United States)
  6. Elettra Sincrotrone Trieste (Italy); National Research Council (CNR), Trieste (Italy). Istituto Officina dei Materiali (IOM)
Publication Date:
Research Org.:
Univ. of Colorado, Boulder, CO (United States); Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); European Research Council (ERC); Gordon and Betty Moore Foundation (GBMF)
OSTI Identifier:
1610410
Alternate Identifier(s):
OSTI ID: 1907871
Grant/Contract Number:  
FG02-99ER14982; SC0001299; SC0019126
Resource Type:
Accepted Manuscript
Journal Name:
Science Advances
Additional Journal Information:
Journal Volume: 5; Journal Issue: 7; Journal ID: ISSN 2375-2548
Publisher:
AAAS
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; Science & Technology - Other Topics

Citation Formats

Bencivenga, Filippo, Mincigrucci, R., Capotondi, F., Foglia, L., Naumenko, D., Maznev, A. A., Pedersoli, E., Simoncig, A., Caporaletti, F., Chiloyan, V., Cucini, R., Dallari, F., Duncan, R. A., Frazer, T. D., Gaio, G., Gessini, A., Giannessi, L., Huberman, S., Kapteyn, H., Knobloch, J., Kurdi, G., Mahne, N., Manfredda, M., Martinelli, A., Murnane, M., Principi, E., Raimondi, L., Spampinati, S., Spezzani, C., Trovò, M., Zangrando, M., Chen, G., Monaco, G., Nelson, K. A., and Masciovecchio, Claudio. Nanoscale transient gratings excited and probed by extreme ultraviolet femtosecond pulses. United States: N. p., 2019. Web. doi:10.1126/sciadv.aaw5805.
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Bencivenga, Filippo, Mincigrucci, R., Capotondi, F., Foglia, L., Naumenko, D., Maznev, A. A., Pedersoli, E., Simoncig, A., Caporaletti, F., Chiloyan, V., Cucini, R., Dallari, F., Duncan, R. A., Frazer, T. D., Gaio, G., Gessini, A., Giannessi, L., Huberman, S., Kapteyn, H., Knobloch, J., Kurdi, G., Mahne, N., Manfredda, M., Martinelli, A., Murnane, M., Principi, E., Raimondi, L., Spampinati, S., Spezzani, C., Trovò, M., Zangrando, M., Chen, G., Monaco, G., Nelson, K. A., & Masciovecchio, Claudio. Nanoscale transient gratings excited and probed by extreme ultraviolet femtosecond pulses. United States. https://doi.org/10.1126/sciadv.aaw5805
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Bencivenga, Filippo, Mincigrucci, R., Capotondi, F., Foglia, L., Naumenko, D., Maznev, A. A., Pedersoli, E., Simoncig, A., Caporaletti, F., Chiloyan, V., Cucini, R., Dallari, F., Duncan, R. A., Frazer, T. D., Gaio, G., Gessini, A., Giannessi, L., Huberman, S., Kapteyn, H., Knobloch, J., Kurdi, G., Mahne, N., Manfredda, M., Martinelli, A., Murnane, M., Principi, E., Raimondi, L., Spampinati, S., Spezzani, C., Trovò, M., Zangrando, M., Chen, G., Monaco, G., Nelson, K. A., and Masciovecchio, Claudio. Fri . "Nanoscale transient gratings excited and probed by extreme ultraviolet femtosecond pulses". United States. https://doi.org/10.1126/sciadv.aaw5805. https://www.osti.gov/servlets/purl/1610410.
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@article{osti_1610410,
title = {Nanoscale transient gratings excited and probed by extreme ultraviolet femtosecond pulses},
author = {Bencivenga, Filippo and Mincigrucci, R. and Capotondi, F. and Foglia, L. and Naumenko, D. and Maznev, A. A. and Pedersoli, E. and Simoncig, A. and Caporaletti, F. and Chiloyan, V. and Cucini, R. and Dallari, F. and Duncan, R. A. and Frazer, T. D. and Gaio, G. and Gessini, A. and Giannessi, L. and Huberman, S. and Kapteyn, H. and Knobloch, J. and Kurdi, G. and Mahne, N. and Manfredda, M. and Martinelli, A. and Murnane, M. and Principi, E. and Raimondi, L. and Spampinati, S. and Spezzani, C. and Trovò, M. and Zangrando, M. and Chen, G. and Monaco, G. and Nelson, K. A. and Masciovecchio, Claudio},
abstractNote = {Advances in developing ultrafast coherent sources operating at extreme ultraviolet (EUV) and x-ray wavelengths allow the extension of nonlinear optical techniques to shorter wavelengths. Here, we describe EUV transient grating spectroscopy, in which two crossed femtosecond EUV pulses produce spatially periodic nanoscale excitations in the sample and their dynamics is probed via diffraction of a third time-delayed EUV pulse. The use of radiation with wavelengths down to 13.3 nm allowed us to produce transient gratings with periods as short as 28 nm and observe thermal and coherent phonon dynamics in crystalline silicon and amorphous silicon nitride. This approach allows measurements of thermal transport on the ~10-nm scale, where the two samples show different heat transport regimes, and can be applied to study other phenomena showing nontrivial behaviors at the nanoscale, such as structural relaxations in complex liquids and ultrafast magnetic dynamics.},
doi = {10.1126/sciadv.aaw5805},
journal = {Science Advances},
number = 7,
volume = 5,
place = {United States},
year = {Fri Jul 26 00:00:00 EDT 2019},
month = {Fri Jul 26 00:00:00 EDT 2019}
}
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https://doi.org/10.1126/sciadv.aaw5805
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The thermal conductivity of silicon nitride membranes is not sensitive to stress
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Nanoscale diffractive probing of strain dynamics in ultrafast transmission electron microscopy
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