Far-field thermal imaging below diffraction limit

Ziabari, Amirkoushyar; Parsa, Maryam; Xuan, Yi; Bahk, Je-Hyeong; Yazawa, Kazuaki; Alvarez, F. Xavier; Shakouri, Ali

doi:10.1364/OE.380866

Title: Far-field thermal imaging below diffraction limit

Abstract

Non-uniform self-heating and temperature hotspots are major concerns compromising the performance and reliability of submicron electronic and optoelectronic devices. At deep submicron scales where effects such as contact-related artifacts and diffraction limits accurate measurements of temperature hotspots, non-contact thermal characterization can be extremely valuable. In this work, we use a Bayesian optimization framework with generalized Gaussian Markov random field (GGMRF) prior model to obtain accurate full-field temperature distribution of self-heated metal interconnects from their thermoreflectance thermal images (TRI) with spatial resolution 2.5 times below Rayleigh limit for 530nm illumination. Finite element simulations along with TRI experimental data were used to characterize the point spread function of the optical imaging system. In addition, unlike iterative reconstruction algorithms that use ad hoc regularization parameters in their prior models to obtain the best quality image, we used numerical experiments and finite element modeling to estimate the regularization parameter for solving a real experimental inverse problem.

Authors:

^[1]; Parsa, Maryam ^[1]; Xuan, Yi ^[2]; Bahk, Je-Hyeong ^[3]; Yazawa, Kazuaki ^[2]; Alvarez, F. Xavier ^[4]; Shakouri, Ali ^[2]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Purdue Univ., West Lafayette, IN (United States)
Purdue Univ., West Lafayette, IN (United States)
Purdue Univ., West Lafayette, IN (United States); Univ. of Cincinnati, OH (United States)
Univ. Autónoma de Barcelona, Bellaterra, Catalonia (Spain)

Publication Date:: Mon Mar 02 00:00:00 EST 2020

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1606852

Grant/Contract Number:: AC05-00OR22725

Resource Type:: Accepted Manuscript

Journal Name:: Optics Express

Additional Journal Information:: Journal Volume: 28; Journal Issue: 5; Journal ID: ISSN 1094-4087

Publisher:: Optical Society of America (OSA)

Country of Publication:: United States

Language:: English

Subject:: 42 ENGINEERING

Citation Formats


                    Ziabari, Amirkoushyar, Parsa, Maryam, Xuan, Yi, Bahk, Je-Hyeong, Yazawa, Kazuaki, Alvarez, F. Xavier, and Shakouri, Ali. Far-field thermal imaging below diffraction limit.  United States: N. p., 2020. 
Web.  doi:10.1364/OE.380866.

Copy to clipboard


                    Ziabari, Amirkoushyar, Parsa, Maryam, Xuan, Yi, Bahk, Je-Hyeong, Yazawa, Kazuaki, Alvarez, F. Xavier, & Shakouri, Ali. Far-field thermal imaging below diffraction limit.  United States.  https://doi.org/10.1364/OE.380866

Copy to clipboard


                    Ziabari, Amirkoushyar, Parsa, Maryam, Xuan, Yi, Bahk, Je-Hyeong, Yazawa, Kazuaki, Alvarez, F. Xavier, and Shakouri, Ali. Mon .  
"Far-field thermal imaging below diffraction limit".  United States.  https://doi.org/10.1364/OE.380866.  https://www.osti.gov/servlets/purl/1606852.

Copy to clipboard


                    
@article{osti_1606852,

  title        = {Far-field thermal imaging below diffraction limit},

  author       = {Ziabari, Amirkoushyar and Parsa, Maryam and Xuan, Yi and Bahk, Je-Hyeong and Yazawa, Kazuaki and Alvarez, F. Xavier and Shakouri, Ali},

  abstractNote = {Non-uniform self-heating and temperature hotspots are major concerns compromising the performance and reliability of submicron electronic and optoelectronic devices. At deep submicron scales where effects such as contact-related artifacts and diffraction limits accurate measurements of temperature hotspots, non-contact thermal characterization can be extremely valuable. In this work, we use a Bayesian optimization framework with generalized Gaussian Markov random field (GGMRF) prior model to obtain accurate full-field temperature distribution of self-heated metal interconnects from their thermoreflectance thermal images (TRI) with spatial resolution 2.5 times below Rayleigh limit for 530nm illumination. Finite element simulations along with TRI experimental data were used to characterize the point spread function of the optical imaging system. In addition, unlike iterative reconstruction algorithms that use ad hoc regularization parameters in their prior models to obtain the best quality image, we used numerical experiments and finite element modeling to estimate the regularization parameter for solving a real experimental inverse problem.},

  doi          = {10.1364/OE.380866},

  journal      = {Optics Express},

  number       = 5,

  volume       = 28,

  place        = {United States},

  year         = {Mon Mar 02 00:00:00 EST 2020},

  month        = {Mon Mar 02 00:00:00 EST 2020}

}

Copy to clipboard

Journal Article:

Free Publicly Available Full Text

Accepted Manuscript (DOE)

Publisher's Version of Record

https://doi.org/10.1364/OE.380866

Other availability

Search WorldCat to find libraries that may hold this journal

Citation Metrics:

Cited by: 3 works

Citation information provided by
Web of Science

Save / Share:

Export Metadata

Save to My Library

Works referenced in this record:

Quantitative Measurement with Scanning Thermal Microscope by Preventing the Distortion Due to the Heat Transfer through the Air
journal, October 2011

Kim, Kyeongtae; Chung, Jaehun; Hwang, Gwangseok
ACS Nano, Vol. 5, Issue 11
DOI: 10.1021/nn2026325

A generalized Gaussian image model for edge-preserving MAP estimation
journal, July 1993

Bouman, C.; Sauer, K.
IEEE Transactions on Image Processing, Vol. 2, Issue 3
DOI: 10.1109/83.236536

Integrated finely tunable microring laser on silicon
journal, September 2016

Liang, D.; Huang, X.; Kurczveil, G.
Nature Photonics, Vol. 10, Issue 11
DOI: 10.1038/nphoton.2016.163

Resolving the thermal challenges for silicon microring resonator devices
journal, January 2014

Padmaraju, Kishore; Bergman, Keren
Nanophotonics, Vol. 3, Issue 4-5
DOI: 10.1515/nanoph-2013-0013

Temperature dependence of Raman scattering in single crystal GaN films
journal, May 1999

Liu, Ming S.; Bursill, Les A.; Prawer, S.
Applied Physics Letters, Vol. 74, Issue 21
DOI: 10.1063/1.124083

Quantitative Thermometry of Nanoscale Hot Spots
journal, January 2012

Menges, Fabian; Riel, Heike; Stemmer, Andreas
Nano Letters, Vol. 12, Issue 2, p. 596-601
DOI: 10.1021/nl203169t

Thermal imaging by atomic force microscopy using thermocouple cantilever probes
journal, June 1995

Majumdar, A.; Lai, J.; Chandrachood, M.
Review of Scientific Instruments, Vol. 66, Issue 6
DOI: 10.1063/1.1145474

Direct Observation of Nanoscale Peltier and Joule Effects at Metal–Insulator Domain Walls in Vanadium Dioxide Nanobeams
journal, April 2014

Favaloro, Tela; Suh, Joonki; Vermeersch, Bjorn
Nano Letters, Vol. 14, Issue 5
DOI: 10.1021/nl500042x

Nanoscale thermometry by scanning thermal microscopy
journal, July 2016

Menges, Fabian; Riel, Heike; Stemmer, Andreas
Review of Scientific Instruments, Vol. 87, Issue 7
DOI: 10.1063/1.4955449

ML parameter estimation for Markov random fields with applications to Bayesian tomography
journal, July 1998

Saquib, S. S.; Bouman, C. A.; Sauer, K.
IEEE Transactions on Image Processing, Vol. 7, Issue 7
DOI: 10.1109/83.701163

Optimal Regularized Reconstruction in Computerized Tomography
journal, November 1987

Girard, Didier A.
SIAM Journal on Scientific and Statistical Computing, Vol. 8, Issue 6
DOI: 10.1137/0908076

Risk estimators for choosing regularization parameters in ill-posed problems - properties and limitations
journal, January 2018

Lucka, Felix; Proksch, Katharina; Brune, Christoph
Inverse Problems & Imaging, Vol. 12, Issue 5
DOI: 10.3934/ipi.2018047

A three-dimensional statistical approach to improved image quality for multislice helical CT: Improved statistical reconstruction for multislice helical CT
journal, October 2007

Thibault, Jean-Baptiste; Sauer, Ken D.; Bouman, Charles A.
Medical Physics, Vol. 34, Issue 11
DOI: 10.1118/1.2789499

A New SURE Approach to Image Denoising: Interscale Orthonormal Wavelet Thresholding
journal, March 2007

Luisier, Florian; Blu, Thierry; Unser, Michael
IEEE Transactions on Image Processing, Vol. 16, Issue 3
DOI: 10.1109/TIP.2007.891064

Nanoscale thermal transport. II. 2003–2012
journal, March 2014

Cahill, David G.; Braun, Paul V.; Chen, Gang
Applied Physics Reviews, Vol. 1, Issue 1
DOI: 10.1063/1.4832615

Temperature mapping of operating nanoscale devices by scanning probe thermometry
journal, March 2016

Menges, Fabian; Mensch, Philipp; Schmid, Heinz
Nature Communications, Vol. 7, Issue 1
DOI: 10.1038/ncomms10874

A SURE Approach for Digital Signal/Image Deconvolution Problems
journal, December 2009

Pesquet, J. -C.; Benazza-Benyahia, A.; Chaux, C.
IEEE Transactions on Signal Processing, Vol. 57, Issue 12
DOI: 10.1109/TSP.2009.2026077

Power Trace: An Efficient Method for Extracting the Power Dissipation Profile in an IC Chip From Its Temperature Map
journal, June 2009

Wang, Xi; Farsiu, Sina; Milanfar, Peyman
IEEE Transactions on Components and Packaging Technologies, Vol. 32, Issue 2
DOI: 10.1109/TCAPT.2009.2017204

Full-field thermal imaging of quasiballistic crosstalk reduction in nanoscale devices
journal, January 2018

Ziabari, Amirkoushyar; Torres, Pol; Vermeersch, Bjorn
Nature Communications, Vol. 9, Issue 1
DOI: 10.1038/s41467-017-02652-4

Thermometry at the nanoscale
journal, January 2012

Brites, Carlos D. S.; Lima, Patricia P.; Silva, Nuno J. O.
Nanoscale, Vol. 4, Issue 16
DOI: 10.1039/c2nr30663h

Emergence of hydrodynamic heat transport in semiconductors at the nanoscale
journal, July 2018

Torres, P.; Ziabari, A.; Torelló, A.
Physical Review Materials, Vol. 2, Issue 7
DOI: 10.1103/PhysRevMaterials.2.076001

A unified approach to statistical tomography using coordinate descent optimization
journal, March 1996

Bouman, C. A.; Sauer, K.
IEEE Transactions on Image Processing, Vol. 5, Issue 3
DOI: 10.1109/83.491321

Evaluating Broader Impacts of Nanoscale Thermal Transport Research
journal, April 2015

Shi, Li; Dames, Chris; Lukes, Jennifer R.
Nanoscale and Microscale Thermophysical Engineering, Vol. 19, Issue 2
DOI: 10.1080/15567265.2015.1031857

Optically coherent image formation and denoising using a plug and play inversion framework
journal, January 2017

Pellizzari, Casey J.; Trahan, Russell; Zhou, Hanying
Applied Optics, Vol. 56, Issue 16
DOI: 10.1364/AO.56.004735

Scaling of High-Field Transport and Localized Heating in Graphene Transistors
journal, September 2011

Bae, Myung-Ho; Islam, Sharnali; Dorgan, Vincent E.
ACS Nano, Vol. 5, Issue 10
DOI: 10.1021/nn202239y

Monte-Carlo Sure: A Black-Box Optimization of Regularization Parameters for General Denoising Algorithms
journal, September 2008

Ramani, S.; Blu, T.; Unser, M.
IEEE Transactions on Image Processing, Vol. 17, Issue 9
DOI: 10.1109/TIP.2008.2001404

Graphene quilts for thermal management of high-power GaN transistors
journal, January 2012

Yan, Zhong; Liu, Guanxiong; Khan, Javed M.
Nature Communications, Vol. 3, Issue 1
DOI: 10.1038/ncomms1828

Nanoscale temperature mapping in operating microelectronic devices
journal, February 2015

Mecklenburg, Matthew; Hubbard, William A.; White, E. R.
Science, Vol. 347, Issue 6222
DOI: 10.1126/science.aaa2433

Nanoscale Joule heating, Peltier cooling and current crowding at graphene–metal contacts
journal, April 2011

Grosse, Kyle L.; Bae, Myung-Ho; Lian, Feifei
Nature Nanotechnology, Vol. 6, Issue 5, p. 287-290
DOI: 10.1038/nnano.2011.39

Nanoscale mapping of temperature and defect evolution inside operating AlGaN/GaN high electron mobility transistors
journal, July 2009

Lin, Chung-Han; Merz, T. A.; Doutt, D. R.
Applied Physics Letters, Vol. 95, Issue 3
DOI: 10.1063/1.3189102

Direct Observation of Self-Heating in III–V Gate-All-Around Nanowire MOSFETs
journal, November 2015

Shin, SangHoon; Wahab, Muhammad Abdul; Masuduzzaman, Muhammad
IEEE Transactions on Electron Devices, Vol. 62, Issue 11
DOI: 10.1109/TED.2015.2444879

Limits of lithography
journal, March 2001

Harriott, L. R.
Proceedings of the IEEE, Vol. 89, Issue 3
DOI: 10.1109/5.915379

Lowering HAMR Near-Field Transducer Temperature via Inverse Electromagnetic Design
journal, April 2015

Bhargava, Samarth; Yablonovitch, Eli
IEEE Transactions on Magnetics, Vol. 51, Issue 4
DOI: 10.1109/TMAG.2014.2355215

Super-Joule heating in graphene and silver nanowire network
journal, April 2015

Maize, Kerry; Das, Suprem R.; Sadeque, Sajia
Applied Physics Letters, Vol. 106, Issue 14
DOI: 10.1063/1.4916943

Fast Model-Based X-Ray CT Reconstruction Using Spatially Nonhomogeneous ICD Optimization
journal, January 2011

Yu, Zhou; Thibault, Jean-Baptiste; Bouman, Charles A.
IEEE Transactions on Image Processing, Vol. 20, Issue 1
DOI: 10.1109/TIP.2010.2058811

Plug-and-Play Priors for Bright Field Electron Tomography and Sparse Interpolation
journal, January 2016

Sreehari, Suhas; Venkatakrishnan, Singanallur V.; Wohlberg, Brendt
IEEE Transactions on Computational Imaging
DOI: 10.1109/TCI.2016.2599778

Probing Thermal Flux in Twinned Ge Nanowires through Raman Spectroscopy
journal, November 2015

Majumdar, Dipanwita; Biswas, Subhajit; Ghoshal, Tandra
ACS Applied Materials & Interfaces, Vol. 7, Issue 44
DOI: 10.1021/acsami.5b07025

Imaging Below the Diffraction Limit: A Statistical Analysis
journal, May 2004

Shahram, M.; Milanfar, P.
IEEE Transactions on Image Processing, Vol. 13, Issue 5
DOI: 10.1109/TIP.2004.826096

Thermoreflectance imaging of sub 100 ns pulsed cooling in high-speed thermoelectric microcoolers
journal, March 2013

Vermeersch, Bjorn; Bahk, Je-Hyeong; Christofferson, James
Journal of Applied Physics, Vol. 113, Issue 10
DOI: 10.1063/1.4794166

Similar Records in DOE PAGES and OSTI.GOV collections:

Super-Joule heating in graphene and silver nanowire network

Journal Article Maize, Kerry ; Das, Suprem R. ; Sadeque, Sajia ; ... - Applied Physics Letters

Transistors, sensors, and transparent conductors based on randomly assembled nanowire networks lean on multi-component percolation for unique and distinctive applications in flexible electronics, biochemical sensing, and solar cells. Although conduction models for 1-D and 1-D/2-D networks have been developed, typically assuming linear electronic transport and self-heating, the model has not been validated by direct high-resolution characterization of coupled electronic pathways and thermal response. In this letter, we show the occurrence of nonlinear “super-Joule” self-heating at the transport bottlenecks in networks of silver nanowires and silver nanowire/single layer graphene hybrid using high resolution thermoreflectance (TR) imaging. TR images at the microscopicmore »« less
Cited by 40
https://doi.org/10.1063/1.4916943

Full Text Available
Super-Joule heating in graphene and silver nanowire network

Journal Article Maize, Kerry ; Das, Suprem R. ; Sadeque, Sajia ; ... - Applied Physics Letters

Transistors, sensors, and transparent conductors based on randomly assembled nanowire networks rely on multi-component percolation for unique and distinctive applications in flexible electronics, biochemical sensing, and solar cells. While conduction models for 1-D and 1-D/2-D networks have been developed, typically assuming linear electronic transport and self-heating, the model has not been validated by direct high-resolution characterization of coupled electronic pathways and thermal response. In this letter, we show the occurrence of nonlinear “super-Joule” self-heating at the transport bottlenecks in networks of silver nanowires and silver nanowire/single layer graphene hybrid using high resolution thermoreflectance (TR) imaging. TR images at the microscopicmore »« less
https://doi.org/10.1063/1.4916943
SU-G-IeP4-03: Cone Beam X-Ray Luminescence Computed Tomography Based On Generalized Gaussian Markov Random Field

Journal Article Zhang, G ; Xing, L - Medical Physics

Purpose: Cone beam X-ray luminescence computed tomography (CB-XLCT), which aims to achieve molecular and functional imaging by X-rays, has recently been proposed as a new imaging modality. However, the inverse problem of CB-XLCT is seriously ill-conditioned, hindering us to achieve good image quality. In this work, a novel reconstruction method based on Bayesian theory is proposed to tackle this problem Methods: Bayesian theory provides a natural framework for utilizing various kinds of available prior information to improve the reconstruction image quality. A generalized Gaussian Markov random field (GGMRF) model is proposed here to construct the prior model of the Bayesianmore »« less
https://doi.org/10.1118/1.4957098
High temperature thermoreflectance imaging and transient Harman characterization of thermoelectric energy conversion devices

Journal Article Favaloro, T. ; Ziabari, A. ; Bahk, J. -H. ; ... - Journal of Applied Physics

Advances in thin film growth technology have enabled the selective engineering of material properties to improve the thermoelectric figure of merit and thus the efficiency of energy conversion devices. Precise characterization at the operational temperature of novel thermoelectric materials is crucial to evaluate their performance and optimize their behavior. However, measurements on thin film devices are subject to complications from the growth substrate, non-ideal contacts, and other thermal and electrical parasitic effects. In this manuscript, we determine the cross-plane thermoelectric material properties in a single measurement of a 25more »« less
Cited by 7
https://doi.org/10.1063/1.4885198

Full Text Available
Thermoreflectance imaging of electromigration evolution in asymmetric aluminum constrictions

Journal Article Tian, Hao ; Ahn, Woojin ; Maize, Kerry ; ... - Journal of Applied Physics

Electromigration (EM) is a phenomenon whereby the flow of current in metal wires moves the underlying atoms, potentially inducing electronic interconnect failures. The continued decrease in commercial lithographically defined feature sizes means that EM presents an increasing risk to the reliability of modern electronics. To mitigate these risks, it is important to look for novel mechanisms to extend lifetime without forfeiting miniaturization. Typically, only the overall increase in the interconnect resistance and failure voltage are characterized. However, if the current flows non-uniformly, spatially resolving the resulting hot spots during electromigration aging experiments may provide better insights into the fundamental mechanismsmore »« less
Cited by 2
https://doi.org/10.1063/1.5005938

Full Text Available

Similar Records

Title: Far-field thermal imaging below diffraction limit

Abstract

Citation Formats

Quantitative Measurement with Scanning Thermal Microscope by Preventing the Distortion Due to the Heat Transfer through the Air journal, October 2011

A generalized Gaussian image model for edge-preserving MAP estimation journal, July 1993

Integrated finely tunable microring laser on silicon journal, September 2016

Resolving the thermal challenges for silicon microring resonator devices journal, January 2014

Temperature dependence of Raman scattering in single crystal GaN films journal, May 1999

Quantitative Thermometry of Nanoscale Hot Spots journal, January 2012

Thermal imaging by atomic force microscopy using thermocouple cantilever probes journal, June 1995

Direct Observation of Nanoscale Peltier and Joule Effects at Metal–Insulator Domain Walls in Vanadium Dioxide Nanobeams journal, April 2014

Nanoscale thermometry by scanning thermal microscopy journal, July 2016

ML parameter estimation for Markov random fields with applications to Bayesian tomography journal, July 1998

Optimal Regularized Reconstruction in Computerized Tomography journal, November 1987

Risk estimators for choosing regularization parameters in ill-posed problems - properties and limitations journal, January 2018

A three-dimensional statistical approach to improved image quality for multislice helical CT: Improved statistical reconstruction for multislice helical CT journal, October 2007

A New SURE Approach to Image Denoising: Interscale Orthonormal Wavelet Thresholding journal, March 2007

Nanoscale thermal transport. II. 2003–2012 journal, March 2014

Temperature mapping of operating nanoscale devices by scanning probe thermometry journal, March 2016

A SURE Approach for Digital Signal/Image Deconvolution Problems journal, December 2009

Power Trace: An Efficient Method for Extracting the Power Dissipation Profile in an IC Chip From Its Temperature Map journal, June 2009

Full-field thermal imaging of quasiballistic crosstalk reduction in nanoscale devices journal, January 2018

Thermometry at the nanoscale journal, January 2012

Emergence of hydrodynamic heat transport in semiconductors at the nanoscale journal, July 2018

A unified approach to statistical tomography using coordinate descent optimization journal, March 1996

Evaluating Broader Impacts of Nanoscale Thermal Transport Research journal, April 2015

Optically coherent image formation and denoising using a plug and play inversion framework journal, January 2017

Scaling of High-Field Transport and Localized Heating in Graphene Transistors journal, September 2011

Monte-Carlo Sure: A Black-Box Optimization of Regularization Parameters for General Denoising Algorithms journal, September 2008

Graphene quilts for thermal management of high-power GaN transistors journal, January 2012

Nanoscale temperature mapping in operating microelectronic devices journal, February 2015

Nanoscale Joule heating, Peltier cooling and current crowding at graphene–metal contacts journal, April 2011

Nanoscale mapping of temperature and defect evolution inside operating AlGaN/GaN high electron mobility transistors journal, July 2009

Direct Observation of Self-Heating in III–V Gate-All-Around Nanowire MOSFETs journal, November 2015

Limits of lithography journal, March 2001

Lowering HAMR Near-Field Transducer Temperature via Inverse Electromagnetic Design journal, April 2015

Super-Joule heating in graphene and silver nanowire network journal, April 2015

Fast Model-Based X-Ray CT Reconstruction Using Spatially Nonhomogeneous ICD Optimization journal, January 2011

Plug-and-Play Priors for Bright Field Electron Tomography and Sparse Interpolation journal, January 2016

Probing Thermal Flux in Twinned Ge Nanowires through Raman Spectroscopy journal, November 2015

Imaging Below the Diffraction Limit: A Statistical Analysis journal, May 2004

Thermoreflectance imaging of sub 100 ns pulsed cooling in high-speed thermoelectric microcoolers journal, March 2013

Quantitative Measurement with Scanning Thermal Microscope by Preventing the Distortion Due to the Heat Transfer through the Air
journal, October 2011

A generalized Gaussian image model for edge-preserving MAP estimation
journal, July 1993

Integrated finely tunable microring laser on silicon
journal, September 2016

Resolving the thermal challenges for silicon microring resonator devices
journal, January 2014

Temperature dependence of Raman scattering in single crystal GaN films
journal, May 1999

Quantitative Thermometry of Nanoscale Hot Spots
journal, January 2012

Thermal imaging by atomic force microscopy using thermocouple cantilever probes
journal, June 1995

Direct Observation of Nanoscale Peltier and Joule Effects at Metal–Insulator Domain Walls in Vanadium Dioxide Nanobeams
journal, April 2014

Nanoscale thermometry by scanning thermal microscopy
journal, July 2016

ML parameter estimation for Markov random fields with applications to Bayesian tomography
journal, July 1998

Optimal Regularized Reconstruction in Computerized Tomography
journal, November 1987

Risk estimators for choosing regularization parameters in ill-posed problems - properties and limitations
journal, January 2018

A three-dimensional statistical approach to improved image quality for multislice helical CT: Improved statistical reconstruction for multislice helical CT
journal, October 2007

A New SURE Approach to Image Denoising: Interscale Orthonormal Wavelet Thresholding
journal, March 2007

Nanoscale thermal transport. II. 2003–2012
journal, March 2014

Temperature mapping of operating nanoscale devices by scanning probe thermometry
journal, March 2016

A SURE Approach for Digital Signal/Image Deconvolution Problems
journal, December 2009

Power Trace: An Efficient Method for Extracting the Power Dissipation Profile in an IC Chip From Its Temperature Map
journal, June 2009

Full-field thermal imaging of quasiballistic crosstalk reduction in nanoscale devices
journal, January 2018

Thermometry at the nanoscale
journal, January 2012

Emergence of hydrodynamic heat transport in semiconductors at the nanoscale
journal, July 2018

A unified approach to statistical tomography using coordinate descent optimization
journal, March 1996

Evaluating Broader Impacts of Nanoscale Thermal Transport Research
journal, April 2015

Optically coherent image formation and denoising using a plug and play inversion framework
journal, January 2017

Scaling of High-Field Transport and Localized Heating in Graphene Transistors
journal, September 2011

Monte-Carlo Sure: A Black-Box Optimization of Regularization Parameters for General Denoising Algorithms
journal, September 2008

Graphene quilts for thermal management of high-power GaN transistors
journal, January 2012

Nanoscale temperature mapping in operating microelectronic devices
journal, February 2015

Nanoscale Joule heating, Peltier cooling and current crowding at graphene–metal contacts
journal, April 2011

Nanoscale mapping of temperature and defect evolution inside operating AlGaN/GaN high electron mobility transistors
journal, July 2009

Direct Observation of Self-Heating in III–V Gate-All-Around Nanowire MOSFETs
journal, November 2015

Limits of lithography
journal, March 2001

Lowering HAMR Near-Field Transducer Temperature via Inverse Electromagnetic Design
journal, April 2015

Super-Joule heating in graphene and silver nanowire network
journal, April 2015

Fast Model-Based X-Ray CT Reconstruction Using Spatially Nonhomogeneous ICD Optimization
journal, January 2011

Plug-and-Play Priors for Bright Field Electron Tomography and Sparse Interpolation
journal, January 2016

Probing Thermal Flux in Twinned Ge Nanowires through Raman Spectroscopy
journal, November 2015

Imaging Below the Diffraction Limit: A Statistical Analysis
journal, May 2004

Thermoreflectance imaging of sub 100 ns pulsed cooling in high-speed thermoelectric microcoolers
journal, March 2013