Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA
Abstract
A method was developed with laser-irradiated Au planar foils to characterize the focal spot of UV laser beams on target at full energy from soft x-ray emission. A pinhole camera with a back-thinned charge-coupled–device detector and filtration with thin Be and Al foil filters provides images of the x-ray emission at photon energies <2 keV. This method requires a careful measurement of the relation between the applied UV fluence and the x-ray signal, which can be described by a power-law dependence. The measured exponent γ ~ 2 provides a dynamic range of ~25 for the inferred UV fluence. UV fluence profiles of selected beams were measured for 100-ps and 1-ns laser pulses and were compared to directly measured profiles from an UV equivalent-target-plane diagnostic. The inferred spot size and super-Gaussian order from the x-ray technique agree within several percent with the values measured with the direct UV measurements.
- Authors:
-
- Univ. of Rochester, NY (United States). Lab. for Laser Energetics
- Publication Date:
- Research Org.:
- Univ. of Rochester, NY (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1598519
- Alternate Identifier(s):
- OSTI ID: 1597538
- Report Number(s):
- 2019-242; 1548; 2505
Journal ID: ISSN 0034-6748; 2019-242, 1548, 2505; TRN: US2103300
- Grant/Contract Number:
- NA0003856
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 91; Journal Issue: 2; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Theobald, W., Sorce, C., Donaldson, W. R., Epstein, R., Keck, R. L., Kellogg, C., Kessler, T. J., Kwiatkowski, J., Marshall, F. J., Sampat, S., Seka, W., Shah, R. C., Shvydky, A., Stoeckl, C., Waxer, L. J., and Regan, S. P. Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA. United States: N. p., 2020.
Web. doi:10.1063/1.5120708.
Theobald, W., Sorce, C., Donaldson, W. R., Epstein, R., Keck, R. L., Kellogg, C., Kessler, T. J., Kwiatkowski, J., Marshall, F. J., Sampat, S., Seka, W., Shah, R. C., Shvydky, A., Stoeckl, C., Waxer, L. J., & Regan, S. P. Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA. United States. https://doi.org/10.1063/1.5120708
Theobald, W., Sorce, C., Donaldson, W. R., Epstein, R., Keck, R. L., Kellogg, C., Kessler, T. J., Kwiatkowski, J., Marshall, F. J., Sampat, S., Seka, W., Shah, R. C., Shvydky, A., Stoeckl, C., Waxer, L. J., and Regan, S. P. Wed .
"Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA". United States. https://doi.org/10.1063/1.5120708. https://www.osti.gov/servlets/purl/1598519.
@article{osti_1598519,
title = {Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA},
author = {Theobald, W. and Sorce, C. and Donaldson, W. R. and Epstein, R. and Keck, R. L. and Kellogg, C. and Kessler, T. J. and Kwiatkowski, J. and Marshall, F. J. and Sampat, S. and Seka, W. and Shah, R. C. and Shvydky, A. and Stoeckl, C. and Waxer, L. J. and Regan, S. P.},
abstractNote = {A method was developed with laser-irradiated Au planar foils to characterize the focal spot of UV laser beams on target at full energy from soft x-ray emission. A pinhole camera with a back-thinned charge-coupled–device detector and filtration with thin Be and Al foil filters provides images of the x-ray emission at photon energies <2 keV. This method requires a careful measurement of the relation between the applied UV fluence and the x-ray signal, which can be described by a power-law dependence. The measured exponent γ ~ 2 provides a dynamic range of ~25 for the inferred UV fluence. UV fluence profiles of selected beams were measured for 100-ps and 1-ns laser pulses and were compared to directly measured profiles from an UV equivalent-target-plane diagnostic. The inferred spot size and super-Gaussian order from the x-ray technique agree within several percent with the values measured with the direct UV measurements.},
doi = {10.1063/1.5120708},
journal = {Review of Scientific Instruments},
number = 2,
volume = 91,
place = {United States},
year = {Wed Feb 05 00:00:00 EST 2020},
month = {Wed Feb 05 00:00:00 EST 2020}
}
Web of Science
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