Search Menu
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information
Search Scholarly Publications

Title: Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction

Abstract

High resolution electron backscatter diffraction (HREBSD), an SEM-based diffraction technique, may be used to measure the lattice distortion of a crystalline material and to infer the geometrically necessary dislocation content. Uncertainty in the image correlation process used to compare diffraction patterns leads to an uneven distribution of measurement noise in terms of the lattice distortion, which results in erroneous identification of dislocation type and density. This work presents a method of reducing noise in HREBSD dislocation measurements by removing the effect of the most problematic components of the measured distortion. The method is then validated by comparing with TEM analysis of dislocation pile-ups near a twin boundary in austenitic stainless steel and with ECCI analysis near a nano-indentation on a tantalum oligocrystal. The HREBSD dislocation microscopy technique is able to resolve individual dislocations visible in TEM and ECCI and correctly identify their Burgers vectors.

Authors:
 [1];  [2];  [3];  [3];  [2]
+ Show Author Affiliations
  1. National Inst. of Aerospace, Hampton, VA (United States); Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  2. Georgia Inst. of Technology, Atlanta, GA (United States)
  3. Michigan State Univ., East Lansing, MI (United States)
Publication Date:
Research Org.:
Georgia Institute of Technology, Atlanta, GA (United States); Michigan State Univ., East Lansing, MI (United States); Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1593338
Alternate Identifier(s):
OSTI ID: 1691443; OSTI ID: 1702708; OSTI ID: 1772006
Report Number(s):
SAND-2020-10939J
Journal ID: ISSN 0304-3991; TRN: US2100918
Grant/Contract Number:  
SC0018960; FG02-09ER46637; SC0001525; AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 210; Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; HREBSD; dislocation microscopy; TEM; ECCI

Citation Formats

Ruggles, T. J., Yoo, Y. S. J., Dunlap, B. E., Crimp, M. A., and Kacher, J. Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction. United States: N. p., 2019. Web. doi:10.1016/j.ultramic.2019.112927.
Copy to clipboard
Ruggles, T. J., Yoo, Y. S. J., Dunlap, B. E., Crimp, M. A., & Kacher, J. Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction. United States. https://doi.org/10.1016/j.ultramic.2019.112927
Copy to clipboard
Ruggles, T. J., Yoo, Y. S. J., Dunlap, B. E., Crimp, M. A., and Kacher, J. Mon . "Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction". United States. https://doi.org/10.1016/j.ultramic.2019.112927. https://www.osti.gov/servlets/purl/1593338.
Copy to clipboard
@article{osti_1593338,
title = {Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction},
author = {Ruggles, T. J. and Yoo, Y. S. J. and Dunlap, B. E. and Crimp, M. A. and Kacher, J.},
abstractNote = {High resolution electron backscatter diffraction (HREBSD), an SEM-based diffraction technique, may be used to measure the lattice distortion of a crystalline material and to infer the geometrically necessary dislocation content. Uncertainty in the image correlation process used to compare diffraction patterns leads to an uneven distribution of measurement noise in terms of the lattice distortion, which results in erroneous identification of dislocation type and density. This work presents a method of reducing noise in HREBSD dislocation measurements by removing the effect of the most problematic components of the measured distortion. The method is then validated by comparing with TEM analysis of dislocation pile-ups near a twin boundary in austenitic stainless steel and with ECCI analysis near a nano-indentation on a tantalum oligocrystal. The HREBSD dislocation microscopy technique is able to resolve individual dislocations visible in TEM and ECCI and correctly identify their Burgers vectors.},
doi = {10.1016/j.ultramic.2019.112927},
journal = {Ultramicroscopy},
number = C,
volume = 210,
place = {United States},
year = {Mon Dec 30 00:00:00 EST 2019},
month = {Mon Dec 30 00:00:00 EST 2019}
}
Copy to clipboard
Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.ultramic.2019.112927
Copyright Statement
Other availability
Search WorldCat Search WorldCat to find libraries that may hold this journal
Citation Metrics:
Cited by: 13 works
Citation information provided by
Web of Science
Save / Share:
Export Metadata
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.

Works referenced in this record:

Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast
journal, January 2006

  • Crimp, Martin A.
  • Microscopy Research and Technique, Vol. 69, Issue 5
  • DOI: 10.1002/jemt.20293

Theory and application of electron channelling contrast imaging under controlled diffraction conditions
journal, August 2014

Demonstration of the g · b x u = 0 edge dislocation invisibility criterion for electron channelling contrast imaging
journal, December 2001

Accurate electron channeling contrast analysis of dislocations in fine grained bulk materials
journal, August 2014

Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries
journal, February 2014

  • Wright, Stuart I.; Nowell, Matthew M.; de Kloe, René
  • Microscopy and Microanalysis, Vol. 20, Issue 3
  • DOI: 10.1017/S143192761400035X

Error analysis of the crystal orientations and disorientations obtained by the classical electron backscatter diffraction technique
journal, May 2015

  • Ram, Farangis; Zaefferer, Stefan; Jäpel, Tom
  • Journal of Applied Crystallography, Vol. 48, Issue 3
  • DOI: 10.1107/S1600576715005762

Orientation imaging microscopy: Emerging and future applications
journal, June 1997

Observations of lattice curvature near the interface of a deformed aluminium bicrystal
journal, January 2000

Experimental lower bounds on geometrically necessary dislocation density
journal, August 2010

Assessment of geometrically necessary dislocation levels derived by 3D EBSD
journal, October 2015

High resolution mapping of strains and rotations using electron backscatter diffraction
journal, November 2006

  • Wilkinson, A. J.; Meaden, G.; Dingley, D. J.
  • Materials Science and Technology, Vol. 22, Issue 11
  • DOI: 10.1179/174328406X130966

EBSD-based continuum dislocation microscopy
journal, August 2010

  • Gardner, Calvin J.; Adams, Brent L.; Basinger, John
  • International Journal of Plasticity, Vol. 26, Issue 8
  • DOI: 10.1016/j.ijplas.2010.05.008

Stress fields and geometrically necessary dislocation density distributions near the head of a blocked slip band
journal, September 2012

Estimations of bulk geometrically necessary dislocation density using high resolution EBSD
journal, October 2013

The orientation and strain dependence of dislocation structure evolution in monotonically deformed polycrystalline copper
journal, June 2015

Resolving geometrically necessary dislocation density onto individual dislocation types using EBSD-based continuum dislocation microscopy
journal, January 2016

Investigation of fatigue crack incubation and growth in cast MAR-M247 subjected to low cycle fatigue at room temperature
journal, May 2017

  • Yeratapally, Saikumar R.; Hochhalter, Jacob D.; Ruggles, Timothy J.
  • International Journal of Fracture, Vol. 208, Issue 1-2
  • DOI: 10.1007/s10704-017-0213-3

Comparison of the dislocation density obtained by HR-EBSD and X-ray profile analysis
journal, February 2017

  • Kalácska, Szilvia; Groma, István; Borbély, András
  • Applied Physics Letters, Vol. 110, Issue 9
  • DOI: 10.1063/1.4977569

Quantifying geometrically necessary dislocations in quartz using HR-EBSD: Application to chessboard subgrain boundaries
journal, August 2019

A comparative assessment of iron and cobalt-based hard-facing alloy deformation using HR-EBSD and HR-DIC
journal, October 2018

Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction
journal, January 2018

Identifying strain localization and dislocation processes in fatigued Inconel 718 manufactured from selective laser melting
journal, May 2018

  • Yoo, Yung Suk Jeremy; Book, Todd A.; Sangid, Michael D.
  • Materials Science and Engineering: A, Vol. 724
  • DOI: 10.1016/j.msea.2018.03.127

Transmission EBSD from 10 nm domains in a scanning electron microscope: TRANSMISSION EBSD IN THE SEM
journal, November 2011

Thermal stability of Ni/NiO multilayers
journal, April 2013

  • Kacher, Josh; Elizaga, Patricia; House, Stephen D.
  • Materials Science and Engineering: A, Vol. 568
  • DOI: 10.1016/j.msea.2013.01.033

Direct Detection of Electron Backscatter Diffraction Patterns
journal, August 2013

Error analysis of the crystal orientations obtained by the dictionary approach to EBSD indexing
journal, October 2017

Improving the precision of orientation measurements from technical materials via EBSD pattern matching
journal, October 2018

Resolving pseudosymmetry in γ-TiAl using cross-correlation electron backscatter diffraction with dynamically simulated reference patterns
journal, April 2018

  • Jackson, Brian; Fullwood, David; Christensen, Jordan
  • Journal of Applied Crystallography, Vol. 51, Issue 3
  • DOI: 10.1107/S1600576718003849

Limits of simulation based high resolution EBSD
journal, August 2013

A consistent full-field integrated DIC framework for HR-EBSD
journal, August 2018

Estimation of elastic strain by integrated image correlation on electron diffraction patterns
journal, April 2019

Analysis of traction-free assumption in high-resolution EBSD measurements: HR-EBSD TRACTION-FREE ASSUMPTION
journal, July 2015

  • Hardin, T. J.; Ruggles, T. J.; Koch, D. P.
  • Journal of Microscopy, Vol. 260, Issue 1
  • DOI: 10.1111/jmi.12268

On solving the orientation gradient dependency of high angular resolution EBSD
journal, February 2012

Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)
journal, March 2017

  • Hansen, Landon T.; Jackson, Brian E.; Fullwood, David T.
  • Microscopy and Microanalysis, Vol. 23, Issue 3
  • DOI: 10.1017/S1431927617000204

The relation between dislocation density and stress
journal, January 1958

Some geometrical relations in dislocated crystals
journal, March 1953

Excess Dislocation Density Measurement Dependence on EBSD Step Size
journal, August 2007

Estimation of dislocation density from precession electron diffraction data using the Nye tensor
journal, June 2015

Innovation and Global eLearning: A Case Study at Brigham Young University-Idaho: Innovation and Global eLearning
journal, March 2016

  • Young, Alan L.
  • New Directions for Higher Education, Vol. 2016, Issue 173
  • DOI: 10.1002/he.20182
    Sort by:
    [ × clear filter / sort ]

    Similar Records in DOE PAGES and OSTI.GOV collections: