Electrostatic subframing and compressive-sensing video in transmission electron microscopy
Abstract
Abstract not provided.
- Authors:
-
[1];
[1];
[1];
[2];
[3];
[2];
[1]
- Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA (United States)
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Oregon State Univ., Corvallis, OR (United States)
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Publication Date:
- Research Org.:
- IDES, Inc., Pleasanton, CA (United States); Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1566126
- Alternate Identifier(s):
- OSTI ID: 1564555; OSTI ID: 1650166; OSTI ID: 1769145
- Report Number(s):
- SAND-2020-8422J; LLNL-JRNL-767422
Journal ID: ISSN 2329-7778; TRN: US2000979
- Grant/Contract Number:
- AC04-94AL85000; SC0013104; NA-0003525; AC52-07NA27344
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Structural Dynamics
- Additional Journal Information:
- Journal Volume: 6; Journal Issue: 5; Journal ID: ISSN 2329-7778
- Publisher:
- American Crystallographic Association/AIP
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE; transmission electron microscopy; time resolution; compressive sensing; electrostatic subframing
Citation Formats
Reed, Bryan W., Moghadam, A. A., Bloom, R. S., Park, S. T., Monterrosa, A. M., Price, P. M., Barr, C. M., Briggs, S. A., Hattar, K., McKeown, J. T., and Masiel, D. J. Electrostatic subframing and compressive-sensing video in transmission electron microscopy. United States: N. p., 2019.
Web. doi:10.1063/1.5115162.
Reed, Bryan W., Moghadam, A. A., Bloom, R. S., Park, S. T., Monterrosa, A. M., Price, P. M., Barr, C. M., Briggs, S. A., Hattar, K., McKeown, J. T., & Masiel, D. J. Electrostatic subframing and compressive-sensing video in transmission electron microscopy. United States. https://doi.org/10.1063/1.5115162
Reed, Bryan W., Moghadam, A. A., Bloom, R. S., Park, S. T., Monterrosa, A. M., Price, P. M., Barr, C. M., Briggs, S. A., Hattar, K., McKeown, J. T., and Masiel, D. J. Mon .
"Electrostatic subframing and compressive-sensing video in transmission electron microscopy". United States. https://doi.org/10.1063/1.5115162. https://www.osti.gov/servlets/purl/1566126.
@article{osti_1566126,
title = {Electrostatic subframing and compressive-sensing video in transmission electron microscopy},
author = {Reed, Bryan W. and Moghadam, A. A. and Bloom, R. S. and Park, S. T. and Monterrosa, A. M. and Price, P. M. and Barr, C. M. and Briggs, S. A. and Hattar, K. and McKeown, J. T. and Masiel, D. J.},
abstractNote = {Abstract not provided.},
doi = {10.1063/1.5115162},
journal = {Structural Dynamics},
number = 5,
volume = 6,
place = {United States},
year = {Mon Sep 23 00:00:00 EDT 2019},
month = {Mon Sep 23 00:00:00 EDT 2019}
}
Free Publicly Available Full Text
Publisher's Version of Record
Other availability
Search WorldCat to find libraries that may hold this journal
Cited by: 11 works
Citation information provided by
Web of Science
Web of Science
Figures / Tables:
FIG. 1: General illustration of electrostatic subframing (ES) in a TEM. (a) A fast two-dimensional electrostatic deflector is inserted below the projector lens and well above the camera, allowing a square array of subframes to be defined (angles exaggerated for illustration). (b) A hypothetical image that could be captured inmore »
All figures and tables
(6 total)
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Near-Optimal Signal Recovery From Random Projections: Universal Encoding Strategies?
journal, January 2006
- Candes, Emmanuel J.; Tao, Terence
- IEEE Transactions on Information Theory, Vol. 52, Issue 12, p. 5406-5425
Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy
journal, February 2016
- Béché, A.; Goris, B.; Freitag, B.
- Applied Physics Letters, Vol. 108, Issue 9
A sub-sampled approach to extremely low-dose STEM
journal, January 2018
- Stevens, A.; Luzi, L.; Yang, H.
- Applied Physics Letters, Vol. 112, Issue 4
The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images
journal, October 2013
- Stevens, Andrew; Yang, Hao; Carin, Lawrence
- Microscopy, Vol. 63, Issue 1
Removing high contrast artifacts via digital inpainting in cryo-electron tomography: An application of compressed sensing
journal, May 2012
- Song, Kahye; Comolli, Luis R.; Horowitz, Mark
- Journal of Structural Biology, Vol. 178, Issue 2
Orientation Maps Derived from TEM Diffraction Patterns Collected with an External CCD Camera
journal, September 2005
- Rauch, Edgar F.; Duft, A.
- Materials Science Forum, Vol. 495-497
Robust uncertainty principles: exact signal reconstruction from highly incomplete frequency information
journal, February 2006
- Candes, E.J.; Romberg, J.; Tao, T.
- IEEE Transactions on Information Theory, Vol. 52, Issue 2, p. 489-509
Rapid low dose electron tomography using a direct electron detection camera
journal, October 2015
- Migunov, Vadim; Ryll, Henning; Zhuge, Xiaodong
- Scientific Reports, Vol. 5, Issue 1
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
journal, February 2008
- Muller, D. A.; Kourkoutis, L. F.; Murfitt, M.
- Science, Vol. 319, Issue 5866
Subsampling and inpainting approaches for electron tomography
journal, November 2017
- Sanders, Toby; Dwyer, Christian
- Ultramicroscopy, Vol. 182
Lasers in additive manufacturing: A review
journal, July 2017
- Lee, Hyub; Lim, Chin Huat Joel; Low, Mun Ji
- International Journal of Precision Engineering and Manufacturing-Green Technology, Vol. 4, Issue 3
The restricted isometry property and its implications for compressed sensing
journal, May 2008
- Candès, Emmanuel J.
- Comptes Rendus Mathematique, Vol. 346, Issue 9-10, p. 589-592
Compressed Sensing Performance Bounds Under Poisson Noise
journal, August 2010
- Raginsky, Maxim; Willett, Rebecca M.; Harmany, Zachary T.
- IEEE Transactions on Signal Processing, Vol. 58, Issue 8
Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector
journal, March 2019
- Song, Jiamei; Allen, Christopher S.; Gao, Si
- Scientific Reports, Vol. 9, Issue 1
Nonlinear total variation based noise removal algorithms
journal, November 1992
- Rudin, Leonid I.; Osher, Stanley; Fatemi, Emad
- Physica D: Nonlinear Phenomena, Vol. 60, Issue 1-4
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
journal, April 2015
- Pennycook, Timothy J.; Lupini, Andrew R.; Yang, Hao
- Ultramicroscopy, Vol. 151, p. 160-167
Compressed sensing
journal, April 2006
- Donoho, D. L.
- IEEE Transactions on Information Theory, Vol. 52, Issue 4
Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy
journal, April 2005
- Stratton, W. G.; Hamann, J.; Perepezko, J. H.
- Applied Physics Letters, Vol. 86, Issue 14
Movie-mode dynamic electron microscopy
journal, January 2015
- LaGrange, Thomas; Reed, Bryan W.; Masiel, Daniel J.
- MRS Bulletin, Vol. 40, Issue 1
The Evolution of Ultrafast Electron Microscope Instrumentation
journal, July 2009
- Reed, B. W.; Armstrong, M. R.; Browning, N. D.
- Microscopy and Microanalysis, Vol. 15, Issue 4
Nonparametric Bayesian Dictionary Learning for Analysis of Noisy and Incomplete Images
journal, January 2012
- Zhou, Mingyuan; Chen, Haojun; Paisley, John
- IEEE Transactions on Image Processing, Vol. 21, Issue 1, p. 130-144
In situ imaging of ultra-fast loss of nanostructure in nanoparticle aggregates
journal, February 2014
- Egan, Garth C.; Sullivan, Kyle T.; LaGrange, Thomas
- Journal of Applied Physics, Vol. 115, Issue 8
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
journal, January 2016
- Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol
- Microscopy and Microanalysis, Vol. 22, Issue 1
Three-Dimensional Morphology of Iron Oxide Nanoparticles with Reactive Concave Surfaces. A Compressed Sensing-Electron Tomography (CS-ET) Approach
journal, November 2011
- Saghi, Zineb; Holland, Daniel J.; Leary, Rowan
- Nano Letters, Vol. 11, Issue 11
Grain Growth in Thin Films
journal, August 1990
- Thompson, C. V.
- Annual Review of Materials Science, Vol. 20, Issue 1
Concurrent in situ ion irradiation transmission electron microscope
journal, November 2014
- Hattar, K.; Bufford, D. C.; Buller, D. L.
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 338
Electron beam dynamics in an ultrafast transmission electron microscope with Wehnelt electrode
journal, December 2016
- Bücker, K.; Picher, M.; Crégut, O.
- Ultramicroscopy, Vol. 171
A High-Speed Electron-Counting Direct Detection Camera for TEM
journal, July 2011
- Mooney, P.; Contarato, D.; Denes, P.
- Microscopy and Microanalysis, Vol. 17, Issue S2
Various Compressed Sensing Setups Evaluated Against Shannon Sampling Under Constraint of Constant Illumination
journal, September 2019
- Van den Broek, Wouter; Reed, Bryan W.; Beche, Armand
- IEEE Transactions on Computational Imaging, Vol. 5, Issue 3
Electron ptychography of 2D materials to deep sub-ångström resolution
journal, July 2018
- Jiang, Yi; Chen, Zhen; Han, Yimo
- Nature, Vol. 559, Issue 7714
Thermal conductivity and diffusivity of free‐standing silicon nitride thin films
journal, February 1995
- Zhang, Xiang; Grigoropoulos, Costas P.
- Review of Scientific Instruments, Vol. 66, Issue 2
Irreversible reactions studied with nanosecond transmission electron microscopy movies: Laser crystallization of phase change materials
journal, April 2013
- Santala, M. K.; Reed, B. W.; Raoux, S.
- Applied Physics Letters, Vol. 102, Issue 17
Surface-Enhanced Raman Spectroscopy
journal, July 2008
- Stiles, Paul L.; Dieringer, Jon A.; Shah, Nilam C.
- Annual Review of Analytical Chemistry, Vol. 1, Issue 1, p. 601-626
A pnCCD-based, fast direct single electron imaging camera for TEM and STEM
journal, April 2016
- Ryll, H.; Simson, M.; Hartmann, R.
- Journal of Instrumentation, Vol. 11, Issue 04
Enhancing Sparsity by Reweighted ℓ 1 Minimization
journal, October 2008
- Candès, Emmanuel J.; Wakin, Michael B.; Boyd, Stephen P.
- Journal of Fourier Analysis and Applications, Vol. 14, Issue 5-6
Total Generalized Variation
journal, January 2010
- Bredies, Kristian; Kunisch, Karl; Pock, Thomas
- SIAM Journal on Imaging Sciences, Vol. 3, Issue 3
Templates for convex cone problems with applications to sparse signal recovery
journal, July 2011
- Becker, Stephen R.; Candès, Emmanuel J.; Grant, Michael C.
- Mathematical Programming Computation, Vol. 3, Issue 3
Compressively Sensed Video Acquisition in Transmission Electron Microscopy
journal, July 2017
- Reed, Bryan W.; Park, Sang Tae; Bloom, Ruth S.
- Microscopy and Microanalysis, Vol. 23, Issue S1
Simulation of thin film grain structures—I. Grain growth stagnation
journal, August 1990
- Frost, H. J.; Thompson, C. V.; Walton, D. T.
- Acta Metallurgica et Materialia, Vol. 38, Issue 8
Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography
journal, March 2009
- Jarausch, Konrad; Thomas, Paul; Leonard, Donovan N.
- Ultramicroscopy, Vol. 109, Issue 4
The effect of thermal grooving on grain boundary motion
journal, June 1958
- Mullins, W. W.
- Acta Metallurgica, Vol. 6, Issue 6
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
journal, August 2008
- Muller, Da; Kourkoutis, Lf; Murfitt, M.
- Microscopy and Microanalysis, Vol. 14, Issue S2
Sub-100 nanosecond temporally resolved imaging with the Medipix3 direct electron detector
dataset, January 2019
- Paterson, Gary; Lamb, Raymond; Ballabriga, Rafael
- University of Glasgow
Compressed sensing performance bounds under Poisson noise
text, January 2009
- Raginsky, Maxim; Willett, Rebecca M.; Harmany, Zachary T.
- arXiv
Templates for Convex Cone Problems with Applications to Sparse Signal Recovery
text, January 2010
- Becker, Stephen R.; Candès, Emmanuel J.; Grant, Michael
- arXiv
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
text, January 2015
- Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol
- arXiv
Robust Uncertainty Principles: Exact Signal Reconstruction from Highly Incomplete Frequency Information
preprint, January 2004
- Candes, Emmanuel; Romberg, Justin; Tao, Terence
- arXiv
Lasers in additive manufacturing: A review
journal, July 2017
- Lee, Hyub; Lim, Chin Huat Joel; Low, Mun Ji
- International Journal of Precision Engineering and Manufacturing-Green Technology, Vol. 4, Issue 3
The effect of thermal grooving on grain boundary motion
journal, June 1958
- Mullins, W. W.
- Acta Metallurgica, Vol. 6, Issue 6
The restricted isometry property and its implications for compressed sensing
journal, May 2008
- Candès, Emmanuel J.
- Comptes Rendus Mathematique, Vol. 346, Issue 9-10, p. 589-592
Removing high contrast artifacts via digital inpainting in cryo-electron tomography: An application of compressed sensing
journal, May 2012
- Song, Kahye; Comolli, Luis R.; Horowitz, Mark
- Journal of Structural Biology, Vol. 178, Issue 2
Concurrent in situ ion irradiation transmission electron microscope
journal, November 2014
- Hattar, K.; Bufford, D. C.; Buller, D. L.
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 338
Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography
journal, March 2009
- Jarausch, Konrad; Thomas, Paul; Leonard, Donovan N.
- Ultramicroscopy, Vol. 109, Issue 4
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
journal, April 2015
- Pennycook, Timothy J.; Lupini, Andrew R.; Yang, Hao
- Ultramicroscopy, Vol. 151, p. 160-167
Electron beam dynamics in an ultrafast transmission electron microscope with Wehnelt electrode
journal, December 2016
- Bücker, K.; Picher, M.; Crégut, O.
- Ultramicroscopy, Vol. 171
Subsampling and inpainting approaches for electron tomography
journal, November 2017
- Sanders, Toby; Dwyer, Christian
- Ultramicroscopy, Vol. 182
Three-Dimensional Morphology of Iron Oxide Nanoparticles with Reactive Concave Surfaces. A Compressed Sensing-Electron Tomography (CS-ET) Approach
journal, November 2011
- Saghi, Zineb; Holland, Daniel J.; Leary, Rowan
- Nano Letters, Vol. 11, Issue 11
Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector
journal, March 2019
- Song, Jiamei; Allen, Christopher S.; Gao, Si
- Scientific Reports, Vol. 9, Issue 1
Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy
journal, April 2005
- Stratton, W. G.; Hamann, J.; Perepezko, J. H.
- Applied Physics Letters, Vol. 86, Issue 14
Irreversible reactions studied with nanosecond transmission electron microscopy movies: Laser crystallization of phase change materials
journal, April 2013
- Santala, M. K.; Reed, B. W.; Raoux, S.
- Applied Physics Letters, Vol. 102, Issue 17
In situ imaging of ultra-fast loss of nanostructure in nanoparticle aggregates
journal, February 2014
- Egan, Garth C.; Sullivan, Kyle T.; LaGrange, Thomas
- Journal of Applied Physics, Vol. 115, Issue 8
Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy
journal, February 2016
- Béché, A.; Goris, B.; Freitag, B.
- Applied Physics Letters, Vol. 108, Issue 9
A sub-sampled approach to extremely low-dose STEM
journal, January 2018
- Stevens, A.; Luzi, L.; Yang, H.
- Applied Physics Letters, Vol. 112, Issue 4
The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images
journal, October 2013
- Stevens, Andrew; Yang, Hao; Carin, Lawrence
- Microscopy, Vol. 63, Issue 1
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
journal, February 2008
- Muller, D. A.; Kourkoutis, L. F.; Murfitt, M.
- Science, Vol. 319, Issue 5866
Total Generalized Variation
journal, January 2010
- Bredies, Kristian; Kunisch, Karl; Pock, Thomas
- SIAM Journal on Imaging Sciences, Vol. 3, Issue 3
Surface-Enhanced Raman Spectroscopy
journal, July 2008
- Stiles, Paul L.; Dieringer, Jon A.; Shah, Nilam C.
- Annual Review of Analytical Chemistry, Vol. 1, Issue 1, p. 601-626
Grain Growth in Thin Films
journal, August 1990
- Thompson, C. V.
- Annual Review of Materials Science, Vol. 20, Issue 1
Templates for Convex Cone Problems with Applications to Sparse Signal Recovery
text, January 2010
- Becker, Stephen R.; Candès, Emmanuel J.; Grant, Michael
- arXiv
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
text, January 2015
- Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol
- arXiv
On some common compressive sensing recovery algorithms and applications - Review paper
preprint, January 2017
- Draganic, Andjela; Orovic, Irena; Stankovic, Srdjan
- arXiv
Figures / Tables found in this record:
Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.