Electric-field noise from thermally activated fluctuators in a surface ion trap
Abstract
We probe electric-field noise near the metal surface of an ion-trap chip in the temperature range from 295 to 530 K. We observe a nontrivial temperature dependence with the noise amplitude at 1 MHz frequency saturating around 500 K. Measurements of the noise spectrum reveal a 1/fα≈1 dependence and a small decrease in α between low and high temperatures. This behavior can be explained by considering noise from a distribution of thermally activated two-level fluctuators with activation energies between 0.35 and 0.65 eV. Processes in this energy range may be relevant to understanding electric-field noise in ion traps; for example, defect motion in the solid state and surface adsorbate binding energies. Lastly, the study of these processes may aid in identification of the origin of excess electric-field noise in ion traps—a major source of ion motional decoherence limiting the performance of surface traps as quantum devices.
- Authors:
-
[1];
- Univ. of California, Berkeley, CA (United States)
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Publication Date:
- Research Org.:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1561446
- Alternate Identifier(s):
- OSTI ID: 1546283
- Report Number(s):
- LLNL-JRNL-759281
Journal ID: ISSN 2469-9926; PLRAAN; 947593; TRN: US2000613
- Grant/Contract Number:
- AC52-07NA27344
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Physical Review A
- Additional Journal Information:
- Journal Volume: 99; Journal Issue: 6; Journal ID: ISSN 2469-9926
- Publisher:
- American Physical Society (APS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 74 ATOMIC AND MOLECULAR PHYSICS
Citation Formats
Noel, Crystal, Berlin-Udi, Maya, Matthiesen, Clemens, Yu, Jessica, Zhou, Yi, Lordi, Vincenzo, and Häffner, Hartmut. Electric-field noise from thermally activated fluctuators in a surface ion trap. United States: N. p., 2019.
Web. doi:10.1103/PhysRevA.99.063427.
Noel, Crystal, Berlin-Udi, Maya, Matthiesen, Clemens, Yu, Jessica, Zhou, Yi, Lordi, Vincenzo, & Häffner, Hartmut. Electric-field noise from thermally activated fluctuators in a surface ion trap. United States. https://doi.org/10.1103/PhysRevA.99.063427
Noel, Crystal, Berlin-Udi, Maya, Matthiesen, Clemens, Yu, Jessica, Zhou, Yi, Lordi, Vincenzo, and Häffner, Hartmut. Wed .
"Electric-field noise from thermally activated fluctuators in a surface ion trap". United States. https://doi.org/10.1103/PhysRevA.99.063427. https://www.osti.gov/servlets/purl/1561446.
@article{osti_1561446,
title = {Electric-field noise from thermally activated fluctuators in a surface ion trap},
author = {Noel, Crystal and Berlin-Udi, Maya and Matthiesen, Clemens and Yu, Jessica and Zhou, Yi and Lordi, Vincenzo and Häffner, Hartmut},
abstractNote = {We probe electric-field noise near the metal surface of an ion-trap chip in the temperature range from 295 to 530 K. We observe a nontrivial temperature dependence with the noise amplitude at 1 MHz frequency saturating around 500 K. Measurements of the noise spectrum reveal a 1/fα≈1 dependence and a small decrease in α between low and high temperatures. This behavior can be explained by considering noise from a distribution of thermally activated two-level fluctuators with activation energies between 0.35 and 0.65 eV. Processes in this energy range may be relevant to understanding electric-field noise in ion traps; for example, defect motion in the solid state and surface adsorbate binding energies. Lastly, the study of these processes may aid in identification of the origin of excess electric-field noise in ion traps—a major source of ion motional decoherence limiting the performance of surface traps as quantum devices.},
doi = {10.1103/PhysRevA.99.063427},
journal = {Physical Review A},
number = 6,
volume = 99,
place = {United States},
year = {Wed Jun 26 00:00:00 EDT 2019},
month = {Wed Jun 26 00:00:00 EDT 2019}
}
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Cited by: 21 works
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Figures / Tables:
FIG. 1: (a) Exploded rendering of the heater and trap setup. The trap is clamped onto the button heater and wirebonded to the chip carrier below. (b) Grey-scale optical microscope image of the trap electrodes with numbers indicating the trapping locations. The electrodes are made of Al and Cu. (c)more »
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Works referencing / citing this record:
Distance scaling and polarization of electric-field noise in a surface ion trap
text, January 2019
- An, Da; Matthiesen, Clemens; Urban, Erik
- arXiv
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