Unexpected significant increase in bulk conductivity of a dielectric arising from charge injection
Abstract
Charge injection is a common phenomenon in heterostructures or devices containing metal-insulator interfaces under a voltage bias ranging from dielectric capacitors to electroluminescent and lasing devices. It is generally believed that charge injection only significantly increases the conductivity near the interfacial region or in capacitors with very thin dielectric layers. In this work, the impact of charge injection on bulk conductivity of a 0.5 mm thick Fe-doped SrTiO3 single crystal is investigated with a combination of experimental impedance measurements and computational modelling. As a result, it is found that the interfacial charge injection may increase the predicted bulk conductivity of a dielectric by more than one order of magnitude as a consequence of Schottky barrier height lowering.
- Authors:
-
- The Pennsylvania State Univ., University Park, PA (United States)
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). National Energy Research Scientific Computing Center (NERSC); Univ. of California, Oakland, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1543836
- Alternate Identifier(s):
- OSTI ID: 1367362
- Grant/Contract Number:
- AC02-05CH11231
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 110; Journal Issue: 26; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Physics
Citation Formats
Wang, Jian -Jun, Bayer, Thorsten J. M., Wang, Rui, Carter, Jared J., Randall, Clive A., and Chen, Long -Qing. Unexpected significant increase in bulk conductivity of a dielectric arising from charge injection. United States: N. p., 2017.
Web. doi:10.1063/1.4990677.
Wang, Jian -Jun, Bayer, Thorsten J. M., Wang, Rui, Carter, Jared J., Randall, Clive A., & Chen, Long -Qing. Unexpected significant increase in bulk conductivity of a dielectric arising from charge injection. United States. https://doi.org/10.1063/1.4990677
Wang, Jian -Jun, Bayer, Thorsten J. M., Wang, Rui, Carter, Jared J., Randall, Clive A., and Chen, Long -Qing. Thu .
"Unexpected significant increase in bulk conductivity of a dielectric arising from charge injection". United States. https://doi.org/10.1063/1.4990677. https://www.osti.gov/servlets/purl/1543836.
@article{osti_1543836,
title = {Unexpected significant increase in bulk conductivity of a dielectric arising from charge injection},
author = {Wang, Jian -Jun and Bayer, Thorsten J. M. and Wang, Rui and Carter, Jared J. and Randall, Clive A. and Chen, Long -Qing},
abstractNote = {Charge injection is a common phenomenon in heterostructures or devices containing metal-insulator interfaces under a voltage bias ranging from dielectric capacitors to electroluminescent and lasing devices. It is generally believed that charge injection only significantly increases the conductivity near the interfacial region or in capacitors with very thin dielectric layers. In this work, the impact of charge injection on bulk conductivity of a 0.5 mm thick Fe-doped SrTiO3 single crystal is investigated with a combination of experimental impedance measurements and computational modelling. As a result, it is found that the interfacial charge injection may increase the predicted bulk conductivity of a dielectric by more than one order of magnitude as a consequence of Schottky barrier height lowering.},
doi = {10.1063/1.4990677},
journal = {Applied Physics Letters},
number = 26,
volume = 110,
place = {United States},
year = {Thu Jun 29 00:00:00 EDT 2017},
month = {Thu Jun 29 00:00:00 EDT 2017}
}
Web of Science
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