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Title: Comparative investigation of electronic transport across three-dimensional nanojunctions

Abstract

We show the thickness-dependent transition from metallic conduction to tunneling in three-dimensional (3D) Ag/Si/Ag nanojunctions through layer-by-layer electronic structure and quantum transport calculations. The transmission coefficients are calculated quantum mechanically within the framework of density functional theory in conjunction with nonequilibrium Green's function techniques. Thin junctions show nearly metallic character with no energy gap opening in Si layers due to the metal-induced interface states, and the transmission is independent of the stacking order of Si layers. An energy gap reemerges for Si layers deeply buried within thick junction, and the decay rate of transmission in this insulating region depends on the stacking order. Complex band analysis indicates that the decay of transmission is not determined by a single exponential constant but also depends on the available number of evanescent states. Calculating the electric resistance from the transmission coefficient requires a 3D generalization of the Landauer formula, which is not unique. We examine two approaches, the Landauer-Büttiker formula, with and without subtraction of the Sharvin resistance, and a semiclassical Boltzmann equation with boundary conditions defined by the transmission coefficients at the junction. We identify an empirical upper limit of ~0.05 per channel in the transmission coefficient, below which the Landauer-Büttiker formulamore » without the Sharvin resistance correction remains a good approximation. In the high transmission limit, the Landauer-Büttiker formula with Sharvin correction and the semiclassical Boltzmann method reach fair agreement.« less

Authors:
 [1];  [1];  [1];  [1]
  1. Univ. of Florida, Gainesville, FL (United States)
Publication Date:
Research Org.:
Univ. of Florida, Gainesville, FL (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1535863
Alternate Identifier(s):
OSTI ID: 1342813
Grant/Contract Number:  
FG02-02ER45995
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 95; Journal Issue: 8; Journal ID: ISSN 2469-9950
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; Materials Science; Physics; Electrical conductivity; Boltzmann theory; Landauer formula

Citation Formats

Wang, Yun-Peng, Zhang, X. -G., Fry, J. N., and Cheng, Hai-Ping. Comparative investigation of electronic transport across three-dimensional nanojunctions. United States: N. p., 2017. Web. doi:10.1103/physrevb.95.085303.
Wang, Yun-Peng, Zhang, X. -G., Fry, J. N., & Cheng, Hai-Ping. Comparative investigation of electronic transport across three-dimensional nanojunctions. United States. https://doi.org/10.1103/physrevb.95.085303
Wang, Yun-Peng, Zhang, X. -G., Fry, J. N., and Cheng, Hai-Ping. Tue . "Comparative investigation of electronic transport across three-dimensional nanojunctions". United States. https://doi.org/10.1103/physrevb.95.085303. https://www.osti.gov/servlets/purl/1535863.
@article{osti_1535863,
title = {Comparative investigation of electronic transport across three-dimensional nanojunctions},
author = {Wang, Yun-Peng and Zhang, X. -G. and Fry, J. N. and Cheng, Hai-Ping},
abstractNote = {We show the thickness-dependent transition from metallic conduction to tunneling in three-dimensional (3D) Ag/Si/Ag nanojunctions through layer-by-layer electronic structure and quantum transport calculations. The transmission coefficients are calculated quantum mechanically within the framework of density functional theory in conjunction with nonequilibrium Green's function techniques. Thin junctions show nearly metallic character with no energy gap opening in Si layers due to the metal-induced interface states, and the transmission is independent of the stacking order of Si layers. An energy gap reemerges for Si layers deeply buried within thick junction, and the decay rate of transmission in this insulating region depends on the stacking order. Complex band analysis indicates that the decay of transmission is not determined by a single exponential constant but also depends on the available number of evanescent states. Calculating the electric resistance from the transmission coefficient requires a 3D generalization of the Landauer formula, which is not unique. We examine two approaches, the Landauer-Büttiker formula, with and without subtraction of the Sharvin resistance, and a semiclassical Boltzmann equation with boundary conditions defined by the transmission coefficients at the junction. We identify an empirical upper limit of ~0.05 per channel in the transmission coefficient, below which the Landauer-Büttiker formula without the Sharvin resistance correction remains a good approximation. In the high transmission limit, the Landauer-Büttiker formula with Sharvin correction and the semiclassical Boltzmann method reach fair agreement.},
doi = {10.1103/physrevb.95.085303},
journal = {Physical Review B},
number = 8,
volume = 95,
place = {United States},
year = {Tue Feb 07 00:00:00 EST 2017},
month = {Tue Feb 07 00:00:00 EST 2017}
}

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