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Title: Direct imaging of ultrafast lattice dynamics

Abstract

Under rapid high-temperature, high-pressure loading, lattices exhibit complex elastic-inelastic responses. The dynamics of these responses are challenging to measure experimentally because of high sample density and extremely small relevant spatial and temporal scales. In this work, we use an x-ray free-electron laser providing simultaneous in situ direct imaging and x-ray diffraction to spatially resolve lattice dynamics of silicon under high–strain rate conditions. We present the first imaging of a new intermediate elastic feature modulating compression along the axis of applied stress, and we identify the structure, compression, and density behind each observed wave. The ultrafast probe x-rays enabled time-resolved characterization of the intermediate elastic feature, which is leveraged to constrain kinetic inhibition of the phase transformation between 2 and 4 ns. These results not only address long-standing questions about the response of silicon under extreme environments but also demonstrate the potential for ultrafast direct measurements to illuminate new lattice dynamics.

Authors:
ORCiD logo [1]; ORCiD logo [2];  [3]; ORCiD logo [4]; ORCiD logo [3]; ORCiD logo [3]; ORCiD logo [3]; ORCiD logo [5];  [6]; ORCiD logo [7]; ORCiD logo [8];  [3]; ORCiD logo [3];  [9]; ORCiD logo [3];  [3]
  1. Stanford Univ., CA (United States)
  2. Los Alamos National Lab. (LANL), Los Alamos, NM (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  4. Univ. of York (United Kingdom)
  5. Univ. of California, Berkeley, CA (United States)
  6. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. of Hamburg (Germany)
  7. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  8. SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  9. SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., CA (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; USDOE Office of Science (SC), Fusion Energy Sciences (FES); German Ministry of Education and Research (BMBF)
OSTI Identifier:
1527344
Grant/Contract Number:  
AC02-76SF00515; 05K13OD2; SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Science Advances
Additional Journal Information:
Journal Volume: 5; Journal Issue: 3; Journal ID: ISSN 2375-2548
Publisher:
AAAS
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Brown, S. Brennan, Gleason, A. E., Galtier, E., Higginbotham, A., Arnold, B., Fry, A., Granados, E., Hashim, A., Schroer, C. G., Schropp, A., Seiboth, F., Tavella, F., Xing, Z., Mao, W., Lee, H. J., and Nagler, B. Direct imaging of ultrafast lattice dynamics. United States: N. p., 2019. Web. doi:10.1126/sciadv.aau8044.
Brown, S. Brennan, Gleason, A. E., Galtier, E., Higginbotham, A., Arnold, B., Fry, A., Granados, E., Hashim, A., Schroer, C. G., Schropp, A., Seiboth, F., Tavella, F., Xing, Z., Mao, W., Lee, H. J., & Nagler, B. Direct imaging of ultrafast lattice dynamics. United States. https://doi.org/10.1126/sciadv.aau8044
Brown, S. Brennan, Gleason, A. E., Galtier, E., Higginbotham, A., Arnold, B., Fry, A., Granados, E., Hashim, A., Schroer, C. G., Schropp, A., Seiboth, F., Tavella, F., Xing, Z., Mao, W., Lee, H. J., and Nagler, B. Fri . "Direct imaging of ultrafast lattice dynamics". United States. https://doi.org/10.1126/sciadv.aau8044. https://www.osti.gov/servlets/purl/1527344.
@article{osti_1527344,
title = {Direct imaging of ultrafast lattice dynamics},
author = {Brown, S. Brennan and Gleason, A. E. and Galtier, E. and Higginbotham, A. and Arnold, B. and Fry, A. and Granados, E. and Hashim, A. and Schroer, C. G. and Schropp, A. and Seiboth, F. and Tavella, F. and Xing, Z. and Mao, W. and Lee, H. J. and Nagler, B.},
abstractNote = {Under rapid high-temperature, high-pressure loading, lattices exhibit complex elastic-inelastic responses. The dynamics of these responses are challenging to measure experimentally because of high sample density and extremely small relevant spatial and temporal scales. In this work, we use an x-ray free-electron laser providing simultaneous in situ direct imaging and x-ray diffraction to spatially resolve lattice dynamics of silicon under high–strain rate conditions. We present the first imaging of a new intermediate elastic feature modulating compression along the axis of applied stress, and we identify the structure, compression, and density behind each observed wave. The ultrafast probe x-rays enabled time-resolved characterization of the intermediate elastic feature, which is leveraged to constrain kinetic inhibition of the phase transformation between 2 and 4 ns. These results not only address long-standing questions about the response of silicon under extreme environments but also demonstrate the potential for ultrafast direct measurements to illuminate new lattice dynamics.},
doi = {10.1126/sciadv.aau8044},
journal = {Science Advances},
number = 3,
volume = 5,
place = {United States},
year = {Fri Mar 08 00:00:00 EST 2019},
month = {Fri Mar 08 00:00:00 EST 2019}
}

Journal Article:
Free Publicly Available Full Text
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Citation Metrics:
Cited by: 18 works
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Figures / Tables:

Fig. 1 Fig. 1: Experimental configuration of optical drive laser and probe x-ray free-electron laser. X-ray diffraction captured the lattice response of shocked silicon, showing dynamics of high-pressure phases and melt. X-ray phase-contrast imaging provided direct snapshots of shock propagation in the target and revealed elastic features. These simultaneous, ultrafast measurements allowedmore » resolution of silicon crystalline phases, compression, and density before and after multiple shock features. Upper inset: Unshocked target construction with the shock direction (direction of applied stress) perpendicular (transverse) to the imaging x-ray axis. FLI, Finger Lakes Instrumentation; FEL, free-electron laser.« less

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Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.