Title: X-ray methods to observe and quantify adhesive penetration into wood

Abstract

To accelerate the development of new and improved wood adhesives for engineered wood products, the optimal penetration of adhesives into wood needs to be determined. Adhesive penetration includes both the flow of adhesives into wood micron-scale voids and the infiltration into the polymer components of the wood cell wall layers. In this work, X-ray computed tomography (XCT) and X-ray fluorescence microscopy (XFM) were used to study adhesive flow and infiltration. Model wood-adhesive bondlines were made using loblolly pine (Pinus taeda) latewood substrates and bromine-substituted phenol formaldehyde (BrPF) resins with different weight average molecular weight (M_W). The Br substitution facilitated both qualitative and quantitative observations using XCT and XFM. The BrPF resin flow into wood was visualized using XCT volume reconstructions and quantified by calculating the weighted penetration (WP). Examination of the shape of the cured BrPF-air interface in longitudinal tracheid lumina revealed that capillary played a role in the majority of BrPF flow into lumina. XFM mapping revealed the pathways of BrPF infiltration into the wood cell walls, and the results were used to calculate BrPF cell wall weight percent gain (WPG_CW) in individual wood cell wall layers. Both WP and WPG_CW decreased with increasing BrPF M_W. Also, the middlemore » lamella had higher WPG_CW than its neighboring secondary cell walls, and within a given bondline the WPG_CW decreased with increasing distance of the cell from the bondline. Along these lines, the results provide new insights that are needed in the development of improved models to understand and predict wood adhesive bondline performance.« less

Authors:

Jakes, Joseph E.  ^[1];

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• Search DOE PAGES for ORCID "0000-0001-9030-5753"

Frihart, Charles R.  ^[1];

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• Search DOE PAGES for ORCID "0000-0002-8140-3770"

Hunt, Christopher G.  ^[1];

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• Search DOE PAGES for ORCID "0000-0002-4799-7085"

Yelle, Daniel J.  ^[1];

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• Search DOE PAGES for ORCID "0000-0001-5321-6778"

Plaza, Nayomi Z.  ^[1];

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• Search DOE PAGES for ORCID "0000-0002-5198-4877"

Lorenz, Linda  ^[1];

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• Search DOE PAGES for ORCID "0000-0002-3150-3191"

Grigsby, Warren  ^[2];

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• Search DOE PAGES for ORCID "0000-0001-8657-0335"

Ching, Daniel J.  ^[3];

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• Search DOE PAGES for ORCID "0000-0003-3992-190X"

Kamke, Fred  ^[3];

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• Search DOE PAGES for ORCID "0000-0003-4389-3980"

Gleber, Sophie-Charlotte ^[4]; Vogt, Stefan  ^[4];

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• Search DOE PAGES for ORCID "0000-0002-8034-5513"

Xiao, Xianghui  ^[4]

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• Search DOE PAGES for ORCID "0000-0002-7142-3452"

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+ Show Author Affiliations

1. Forest Products Lab., Madison, WI (United States)
2. Scion, Rotorua (New Zealand)
3. Oregon State Univ., Corvallis, OR (United States)
4. Argonne National Lab. (ANL), Lemont, IL (United States). Advanced Photon Source

Publication Date:

Tue Aug 21 00:00:00 EDT 2018

Research Org.:

Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org.:

USDOE Office of Science (SC), Advanced Photon Source (APS)

OSTI Identifier:

1501869

Grant/Contract Number:  

AC02-06CH11357

Resource Type:

Accepted Manuscript

Journal Name:

Journal of Materials Science

Additional Journal Information:

Journal Volume: 54; Journal Issue: 1; Journal ID: ISSN 0022-2461

Publisher:

Springer

Country of Publication:

United States

Language:

English

Subject:

36 MATERIALS SCIENCE