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Title: Less is More: Improved Thermal Stability and Plasmonic Response in Au Films via the Use of SubNanometer Ti Adhesion Layers

Abstract

The use of a metallic adhesion layer is known to increase the thermo-mechanical stability of Au thin films against solid-state dewetting, but in turn results in damping of the plasmonic response, reducing their utility in applications such as heat-assisted magnetic recording (HAMR). In this work, 50 nm Au films with Ti adhesion layers ranging in thickness from 0 to 5 nm were fabricated, and their thermal stability, electrical resistivity, and plasmonic response were measured. Subnanometer adhesion layers are demonstrated to significantly increase the stability of the thin films against dewetting at elevated temperatures (>200 °C), compared to more commonly used adhesion layer thicknesses that are in the range of 2-5 nm. For adhesion layers thicker than 1 nm, the diffusion of excess Ti through Au grain boundaries and subsequent oxidation was determined to result in degradation of the film. This mechanism was confirmed using transmission electron microscopy and X-ray photoelectron spectroscopy on annealed 0.5 and 5 nm adhesion layer samples. The superiority of subnanometer adhesion layers was further demonstrated through measurements of the surface-plasmon polariton resonance; those with thinner adhesion layers possessed both a stronger and spectrally sharper resonance. Furthermore, these results have relevance beyond HAMR to all Ti/Au systemsmore » operating at elevated temperatures.« less

Authors:
ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [1];  [1]; ORCiD logo [1]
  1. Trinity College Dublin, Dublin (Ireland)
  2. Argonne National Lab. (ANL), Lemont, IL (United States); Northwestern Univ., Evanston, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1500000
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
ACS Applied Materials and Interfaces
Additional Journal Information:
Journal Volume: 11; Journal Issue: 7; Journal ID: ISSN 1944-8244
Publisher:
American Chemical Society (ACS)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE; adhesion; antidewetting; diffusion; gold thin films; heat-assisted magnetic recording; plasmonics

Citation Formats

Abbott, William M., Murray, Christopher P., Zhong, Chuan, Smith, Christopher, McGuinness, Cormac, Rezvani, Ehsan, Downing, Clive, Daly, Dermot, Petford-Long, Amanda K., Bello, Frank, McCloskey, David, and Donegan, John F. Less is More: Improved Thermal Stability and Plasmonic Response in Au Films via the Use of SubNanometer Ti Adhesion Layers. United States: N. p., 2019. Web. doi:10.1021/acsami.8b21193.
Abbott, William M., Murray, Christopher P., Zhong, Chuan, Smith, Christopher, McGuinness, Cormac, Rezvani, Ehsan, Downing, Clive, Daly, Dermot, Petford-Long, Amanda K., Bello, Frank, McCloskey, David, & Donegan, John F. Less is More: Improved Thermal Stability and Plasmonic Response in Au Films via the Use of SubNanometer Ti Adhesion Layers. United States. https://doi.org/10.1021/acsami.8b21193
Abbott, William M., Murray, Christopher P., Zhong, Chuan, Smith, Christopher, McGuinness, Cormac, Rezvani, Ehsan, Downing, Clive, Daly, Dermot, Petford-Long, Amanda K., Bello, Frank, McCloskey, David, and Donegan, John F. Fri . "Less is More: Improved Thermal Stability and Plasmonic Response in Au Films via the Use of SubNanometer Ti Adhesion Layers". United States. https://doi.org/10.1021/acsami.8b21193. https://www.osti.gov/servlets/purl/1500000.
@article{osti_1500000,
title = {Less is More: Improved Thermal Stability and Plasmonic Response in Au Films via the Use of SubNanometer Ti Adhesion Layers},
author = {Abbott, William M. and Murray, Christopher P. and Zhong, Chuan and Smith, Christopher and McGuinness, Cormac and Rezvani, Ehsan and Downing, Clive and Daly, Dermot and Petford-Long, Amanda K. and Bello, Frank and McCloskey, David and Donegan, John F.},
abstractNote = {The use of a metallic adhesion layer is known to increase the thermo-mechanical stability of Au thin films against solid-state dewetting, but in turn results in damping of the plasmonic response, reducing their utility in applications such as heat-assisted magnetic recording (HAMR). In this work, 50 nm Au films with Ti adhesion layers ranging in thickness from 0 to 5 nm were fabricated, and their thermal stability, electrical resistivity, and plasmonic response were measured. Subnanometer adhesion layers are demonstrated to significantly increase the stability of the thin films against dewetting at elevated temperatures (>200 °C), compared to more commonly used adhesion layer thicknesses that are in the range of 2-5 nm. For adhesion layers thicker than 1 nm, the diffusion of excess Ti through Au grain boundaries and subsequent oxidation was determined to result in degradation of the film. This mechanism was confirmed using transmission electron microscopy and X-ray photoelectron spectroscopy on annealed 0.5 and 5 nm adhesion layer samples. The superiority of subnanometer adhesion layers was further demonstrated through measurements of the surface-plasmon polariton resonance; those with thinner adhesion layers possessed both a stronger and spectrally sharper resonance. Furthermore, these results have relevance beyond HAMR to all Ti/Au systems operating at elevated temperatures.},
doi = {10.1021/acsami.8b21193},
journal = {ACS Applied Materials and Interfaces},
number = 7,
volume = 11,
place = {United States},
year = {Fri Jan 25 00:00:00 EST 2019},
month = {Fri Jan 25 00:00:00 EST 2019}
}

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Works referenced in this record:

Ultra-thin films for plasmonics: a technology overview
journal, January 2015


Dewetting behavior of electron-beam-deposited Au thin films on various substrates: graphenes, quartz, and SiO2 wafers
journal, December 2014


Influence of Ti and Cr Adhesion Layers on Ultrathin Au Films
journal, October 2017

  • Todeschini, Matteo; Bastos da Silva Fanta, Alice; Jensen, Flemming
  • ACS Applied Materials & Interfaces, Vol. 9, Issue 42
  • DOI: 10.1021/acsami.7b10136

Titanium diffusion in gold thin films
journal, March 2010


Effects of temperature, thickness and atmosphere on mixing in Au-Ti bilayer thin films
journal, September 1993

  • Masahiro, Kitada; Noboru, Shimizu
  • Journal of Materials Science, Vol. 28, Issue 18
  • DOI: 10.1007/bf00361184

Improvement of bonding strength between Au/Ti and SiO2 films by Si layer insertion
journal, May 1999

  • Nagata, Hirotoshi; Shinriki, Takashi; Shima, Kaori
  • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 17, Issue 3
  • DOI: 10.1116/1.581676

Metallic Adhesion Layer Induced Plasmon Damping and Molecular Linker as a Nondamping Alternative
journal, May 2012

  • Habteyes, Terefe G.; Dhuey, Scott; Wood, Erin
  • ACS Nano, Vol. 6, Issue 6
  • DOI: 10.1021/nn301885u

Observing Plasmon Damping Due to Adhesion Layers in Gold Nanostructures Using Electron Energy Loss Spectroscopy
journal, January 2017


Thermo-plasmonics: using metallic nanostructures as nano-sources of heat: Thermoplasmonics
journal, April 2012


On the lifetime of plasmonic transducers in heat assisted magnetic recording
journal, August 2012

  • Budaev, Bair V.; Bogy, David B.
  • Journal of Applied Physics, Vol. 112, Issue 3
  • DOI: 10.1063/1.4745050

Surface plasmon damping effects due to Ti adhesion layer in individual gold nanodisks
journal, December 2016

  • Debu, Desalegn T.; Ghosh, Pijush K.; French, David
  • Optical Materials Express, Vol. 7, Issue 1
  • DOI: 10.1364/ome.7.000073

Characterization of thin titanium oxide adhesion layers on gold: resistivity, morphology, and composition
journal, January 1994


Annealing of CoFeB/MgO based single and double barrier magnetic tunnel junctions: Tunnel magnetoresistance, bias dependence, and output voltage
journal, February 2009

  • Feng, G.; van Dijken, Sebastiaan; Feng, J. F.
  • Journal of Applied Physics, Vol. 105, Issue 3
  • DOI: 10.1063/1.3068186

Solid-State Dewetting of Thin Films
journal, August 2012


Solid state dewetting of thin plasmonic films under focused cw-laser irradiation
journal, February 2018


Capillary instabilities in thin, continuous films
journal, February 1992


The process of solid-state dewetting of Au thin films studied by in situ scanning transmission electron microscopy
journal, May 2015


Platinum Hillocks in Pt/Ti Film Stacks Deposited on Thermally Oxidized Si Substrate
journal, October 2001

  • Kweon, Soon Yong; Choi, Si Kyung; Yeom, Seung Jin
  • Japanese Journal of Applied Physics, Vol. 40, Issue Part 1, No. 10
  • DOI: 10.1143/jjap.40.5850

Spectroscopy of ultrathin epitaxial rutile TiO2(110) films grown on W(100)
journal, August 2007

  • Bennett, R. A.; Mulley, J. S.; Newton, M. A.
  • The Journal of Chemical Physics, Vol. 127, Issue 8
  • DOI: 10.1063/1.2756842

Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces
journal, January 1999

  • Powell, C. J.; Jablonski, A.
  • Journal of Physical and Chemical Reference Data, Vol. 28, Issue 1
  • DOI: 10.1063/1.556035

Plasmonic Films Can Easily Be Better: Rules and Recipes
journal, February 2015

  • McPeak, Kevin M.; Jayanti, Sriharsha V.; Kress, Stephan J. P.
  • ACS Photonics, Vol. 2, Issue 3
  • DOI: 10.1021/ph5004237

Engineering Metal Adhesion Layers That Do Not Deteriorate Plasmon Resonances
journal, March 2013

  • Siegfried, Thomas; Ekinci, Yasin; Martin, Olivier J. F.
  • ACS Nano, Vol. 7, Issue 3
  • DOI: 10.1021/nn4002006

Dewetting of Au and AuPt alloy films: A dewetting zone model
journal, March 2013

  • Manuela Müller, Claudia; Spolenak, Ralph
  • Journal of Applied Physics, Vol. 113, Issue 9
  • DOI: 10.1063/1.4794028

Thin‐film interdiffusion. I. Au‐Pd, Pd‐Au, Ti‐Pd, Ti‐Au, Ti‐Pd‐Au, and Ti‐Au‐Pd
journal, October 1975

  • Poate, J. M.; Turner, P. A.; DeBonte, W. J.
  • Journal of Applied Physics, Vol. 46, Issue 10
  • DOI: 10.1063/1.321411

Grain boundary diffusion in thin films under stress fields
journal, May 2001


Stress-induced spontaneous dewetting of heteroepitaxial Y Ba 2 Cu 3 O 7 thin films
journal, February 2006


Works referencing / citing this record:

Adhesion layer influence on controlling the local temperature in plasmonic gold nanoholes
journal, January 2020

  • Jiang, Quanbo; Rogez, Benoît; Claude, Jean-Benoît
  • Nanoscale, Vol. 12, Issue 4
  • DOI: 10.1039/c9nr08113e