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Title: Counting the electrons in a multiphoton ionization by elastic scattering of microwaves

Abstract

Multiphoton ionization (MPI) is a fundamental first step in high-energy laser-matter interaction and is important for understanding the mechanism of plasma formation. With the discovery of MPI more than 50 years ago, there were numerous attempts to determine the basic physical constants of this process in direct experiments, namely photoionization rates and cross-sections of the MPI; however, no reliable data was available until now, and the spread in the literature values often reaches 2–3 orders of magnitude. This is due to the inability to conduct absolute measurements of plasma electron numbers generated by MPI, which leads to uncertainties and, sometimes, contradictions between MPI cross-section values utilized by different researchers across the field. Here, we report the first direct measurement of absolute plasma electron numbers generated at MPI of air, and subsequently we precisely determine the ionization rate and cross-section of eight-photon ionization of oxygen molecule by 800 nm photons σ8 = (3.3 ± 0.3)×10-130 W-8m16s-1. The method, based on the absolute measurement of the electron number created by MPI using elastic scattering of microwaves off the plasma volume in Rayleigh regime, establishes a general approach to directly measure and tabulate basic constants of the MPI process for various gases andmore » photon energies.« less

Authors:
 [1]; ORCiD logo [2];  [3];  [1];  [2];  [1]
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  1. Purdue Univ., West Lafayette, IN (United States). School of Aeronautics and Astronautics
  2. Purdue Univ., West Lafayette, IN (United States). School of Mechanical Engineering
  3. Princeton Univ., NJ (United States). Dept. of Mechanical and Aerospace Engineering
Publication Date:
Research Org.:
Purdue Univ., West Lafayette, IN (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Fusion Energy Sciences (FES); National Science Foundation (NSF)
OSTI Identifier:
1499979
Grant/Contract Number:  
SC0018156; 1465061
Resource Type:
Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 8; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; laser-produced plasmas; plasma physics

Citation Formats

Sharma, A., Slipchenko, M. N., Shneider, M. N., Wang, X., Rahman, K. A., and Shashurin, A. Counting the electrons in a multiphoton ionization by elastic scattering of microwaves. United States: N. p., 2018. Web. doi:10.1038/s41598-018-21234-y.
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Sharma, A., Slipchenko, M. N., Shneider, M. N., Wang, X., Rahman, K. A., & Shashurin, A. Counting the electrons in a multiphoton ionization by elastic scattering of microwaves. United States. https://doi.org/10.1038/s41598-018-21234-y
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Sharma, A., Slipchenko, M. N., Shneider, M. N., Wang, X., Rahman, K. A., and Shashurin, A. Tue . "Counting the electrons in a multiphoton ionization by elastic scattering of microwaves". United States. https://doi.org/10.1038/s41598-018-21234-y. https://www.osti.gov/servlets/purl/1499979.
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@article{osti_1499979,
title = {Counting the electrons in a multiphoton ionization by elastic scattering of microwaves},
author = {Sharma, A. and Slipchenko, M. N. and Shneider, M. N. and Wang, X. and Rahman, K. A. and Shashurin, A.},
abstractNote = {Multiphoton ionization (MPI) is a fundamental first step in high-energy laser-matter interaction and is important for understanding the mechanism of plasma formation. With the discovery of MPI more than 50 years ago, there were numerous attempts to determine the basic physical constants of this process in direct experiments, namely photoionization rates and cross-sections of the MPI; however, no reliable data was available until now, and the spread in the literature values often reaches 2–3 orders of magnitude. This is due to the inability to conduct absolute measurements of plasma electron numbers generated by MPI, which leads to uncertainties and, sometimes, contradictions between MPI cross-section values utilized by different researchers across the field. Here, we report the first direct measurement of absolute plasma electron numbers generated at MPI of air, and subsequently we precisely determine the ionization rate and cross-section of eight-photon ionization of oxygen molecule by 800 nm photons σ8 = (3.3 ± 0.3)×10-130 W-8m16s-1. The method, based on the absolute measurement of the electron number created by MPI using elastic scattering of microwaves off the plasma volume in Rayleigh regime, establishes a general approach to directly measure and tabulate basic constants of the MPI process for various gases and photon energies.},
doi = {10.1038/s41598-018-21234-y},
journal = {Scientific Reports},
number = ,
volume = 8,
place = {United States},
year = {Tue Feb 13 00:00:00 EST 2018},
month = {Tue Feb 13 00:00:00 EST 2018}
}
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Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1038/s41598-018-21234-y
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Cited by: 36 works
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Figures / Tables:

Figure 1. Figure 1.: Experimental setup and RMS homodyne system. A 800 nm Ti:Sapphire femtosecond laser operating at a repetition rate of 100 Hz was focused using a 1000 mm plano-convex lens to create the plasma. A homodyne-type Rayleigh Microwave Scattering system calibrated against dielectric scatterers was used to measure the absolutemore » number of electrons in the plasma volume.« less
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Effect of power losses on self-focusing of high-intensity laser beam in gases
journal, April 2013

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    Works referencing / citing this record:

    Direct measurement of electron numbers created at near-infrared laser-induced ionization of various gases
    journal, May 2019

    • Sharma, A.; Slipchenko, M. N.; Rahman, K. A.
    • Journal of Applied Physics, Vol. 125, Issue 19
    • DOI: 10.1063/1.5082551

    Pressure-scaling characteristics of femtosecond two-photon laser-induced fluorescence of carbon monoxide
    journal, January 2019

    • Rahman, K. Arafat; Athmanathan, Venkat; Slipchenko, Mikhail N.
    • Applied Optics, Vol. 58, Issue 27
    • DOI: 10.1364/ao.58.007458
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