Atomically Thin CBRAM Enabled by 2-D Materials: Scaling Behaviors and Performance Limits
Abstract
Reducing the energy and power dissipation of conductive bridge random access memory (CBRAM) cells is of critical importance for their applications in future Internet of Things (IoT) device and neuromorphic computing platforms. Atomically thin CBRAMs enabled by 2-D materials are studied theoretically by using 3-D kinetic Monte Carlo simulations together with experimental characterization. The results indicate the performance potential of attoJoule energy dissipation for intrinsic filament formation and a filament size of a single atomistic chain in such a CBRAM cell. The atomically thin CBRAM cells also show qualitatively different features from conventional CBRAM cells, including complete rupture of the filament in the reset stage and comparable forming and set voltages. The scaling and variability of the CBRAM cells down to sub-nanometer size of the switching layer as realized in the experiment are systematically studied, which indicates performance improvement and increased relative variability as the switching layer scales down. Finally, the results establish the ultimate limits of the size and energy scaling for CBRAM cells and illustrate the unique application of 2-D materials in ultralow power memory devices.
- Authors:
-
- Univ. of Florida, Gainesville, FL (United States). Dept. of Electrical and Computer Engineering
- Univ. of Southern California, Los Angeles, CA (United States). Ming Hsieh Dept. of Electrical Engineering
- NG Next, Northrop Grumman Corporation, Redondo Beach, CA (United States)
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Publication Date:
- Research Org.:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1477961
- Report Number(s):
- BNL-209193-2018-JAAM
Journal ID: ISSN 0018-9383
- Grant/Contract Number:
- SC0012704
- Resource Type:
- Accepted Manuscript
- Journal Name:
- IEEE Transactions on Electron Devices
- Additional Journal Information:
- Journal Volume: 65; Journal Issue: 10; Journal ID: ISSN 0018-9383
- Publisher:
- IEEE
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Citation Formats
Dong, Zhipeng, Zhao, Huan, DiMarzio, Don, Han, Myung-Geun, Zhang, Lihua, Tice, Jesse, Wang, Han, and Guo, Jing. Atomically Thin CBRAM Enabled by 2-D Materials: Scaling Behaviors and Performance Limits. United States: N. p., 2018.
Web. doi:10.1109/TED.2018.2830328.
Dong, Zhipeng, Zhao, Huan, DiMarzio, Don, Han, Myung-Geun, Zhang, Lihua, Tice, Jesse, Wang, Han, & Guo, Jing. Atomically Thin CBRAM Enabled by 2-D Materials: Scaling Behaviors and Performance Limits. United States. https://doi.org/10.1109/TED.2018.2830328
Dong, Zhipeng, Zhao, Huan, DiMarzio, Don, Han, Myung-Geun, Zhang, Lihua, Tice, Jesse, Wang, Han, and Guo, Jing. Tue .
"Atomically Thin CBRAM Enabled by 2-D Materials: Scaling Behaviors and Performance Limits". United States. https://doi.org/10.1109/TED.2018.2830328. https://www.osti.gov/servlets/purl/1477961.
@article{osti_1477961,
title = {Atomically Thin CBRAM Enabled by 2-D Materials: Scaling Behaviors and Performance Limits},
author = {Dong, Zhipeng and Zhao, Huan and DiMarzio, Don and Han, Myung-Geun and Zhang, Lihua and Tice, Jesse and Wang, Han and Guo, Jing},
abstractNote = {Reducing the energy and power dissipation of conductive bridge random access memory (CBRAM) cells is of critical importance for their applications in future Internet of Things (IoT) device and neuromorphic computing platforms. Atomically thin CBRAMs enabled by 2-D materials are studied theoretically by using 3-D kinetic Monte Carlo simulations together with experimental characterization. The results indicate the performance potential of attoJoule energy dissipation for intrinsic filament formation and a filament size of a single atomistic chain in such a CBRAM cell. The atomically thin CBRAM cells also show qualitatively different features from conventional CBRAM cells, including complete rupture of the filament in the reset stage and comparable forming and set voltages. The scaling and variability of the CBRAM cells down to sub-nanometer size of the switching layer as realized in the experiment are systematically studied, which indicates performance improvement and increased relative variability as the switching layer scales down. Finally, the results establish the ultimate limits of the size and energy scaling for CBRAM cells and illustrate the unique application of 2-D materials in ultralow power memory devices.},
doi = {10.1109/TED.2018.2830328},
journal = {IEEE Transactions on Electron Devices},
number = 10,
volume = 65,
place = {United States},
year = {Tue May 08 00:00:00 EDT 2018},
month = {Tue May 08 00:00:00 EDT 2018}
}
Web of Science
Figures / Tables:
Works referencing / citing this record:
Emerging Artificial Synaptic Devices for Neuromorphic Computing
journal, February 2019
- Wan, Qingzhou; Sharbati, Mohammad T.; Erickson, John R.
- Advanced Materials Technologies, Vol. 4, Issue 4
Quantized Conduction Device with 6‐Bit Storage Based on Electrically Controllable Break Junctions
journal, September 2019
- Banerjee, Writam; Hwang, Hyunsang
- Advanced Electronic Materials, Vol. 5, Issue 12
Ultra compact electrochemical metallization cells offering reproducible atomic scale memristive switching
journal, March 2019
- Cheng, Bojun; Emboras, Alexandros; Salamin, Yannick
- Communications Physics, Vol. 2, Issue 1
Efficient learning and crossbar operations with atomically-thin 2-D material compound synapses
journal, October 2018
- Sanchez Esqueda, Ivan; Zhao, Huan; Wang, Han
- Journal of Applied Physics, Vol. 124, Issue 15
High on/off ratio black phosphorus based memristor with ultra-thin phosphorus oxide layer
journal, November 2019
- Wang, Yudan; Wu, Facai; Liu, Xingqiang
- Applied Physics Letters, Vol. 115, Issue 19
Ultra compact electrochemical metallization cells offering reproducible atomic scale memristive switching
text, January 2019
- Cheng, Bojun; Emboras, Alexandros; Salamin, Yannick
- ETH Zurich