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Title: Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives

Abstract

We introduce a simulation framework for the transport of high and low energy electrons in xenon-based optical time projection chambers (OTPCs). The simulation relies on elementary cross sections (electron–atom and electron–molecule) and incorporates, in order to compute the gas scintillation, the reaction/quenching rates (atom–atom and atom–molecule) of the first 41 excited states of xenon and the relevant associated excimers, together with their radiative cascade. The results compare positively with observations made in pure xenon and its mixtures with CO2 and CF4 in a range of pressures from 0.1 to 10 bar. This work sheds some light on the elementary processes responsible for the primary and secondary xenon-scintillation mechanisms in the presence of additives, that are of interest to the OTPC technology.

Authors:
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Publication Date:
Research Org.:
Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), High Energy Physics (HEP)
Contributing Org.:
NEXT Collaboration
OSTI Identifier:
1468421
Alternate Identifier(s):
OSTI ID: 1549287
Report Number(s):
FERMILAB-PUB-17-267-CD; arXiv:1705.09481
Journal ID: ISSN 0168-9002; 1601414
Grant/Contract Number:  
AC02-07CH11359; FG02-13ER42020
Resource Type:
Accepted Manuscript
Journal Name:
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Additional Journal Information:
Journal Volume: 877; Journal Issue: C; Journal ID: ISSN 0168-9002
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Azevedo, C. D. R., González-Díaz, D., Biagi, S. F., Oliveira, C. A. B., Henriques, C. A. O., Escada, J., Monrabal, F., Gómez-Cadenas, J. J., Álvarez, V., Benlloch-Rodríguez, J. M., Borges, F. I. G. M., Botas, A., Cárcel, S., Carrión, J. V., Cebrián, S., Conde, C. A. N., Díaz, J., Diesburg, M., Esteve, R., Felkai, R., Fernandes, L. M. P., Ferrario, P., Ferreira, A. L., Freitas, E. D. C., Goldschmidt, A., Gutiérrez, R. M., Hauptman, J., Hernandez, A. I., Morata, J. A. Hernando, Herrero, V., Jones, B. J. P., Labarga, L., Laing, A., Lebrun, P., Liubarsky, I., Lopez-March, N., Losada, M., Martín-Albo, J., Martínez-Lema, G., Martínez, A., McDonald, A. D., Monteiro, C. M. B., Mora, F. J., Moutinho, L. M., Vidal, J. Muñoz, Musti, M., Nebot-Guinot, M., Novella, P., Nygren, D., Palmeiro, B., Para, A., Pérez, J., Querol, M., Renner, J., Ripoll, L., Rodríguez, J., Rogers, L., Santos, F. P., dos Santos, J. M. F., Serra, L., Shuman, D., Simón, A., Sofka, C., Sorel, M., Stiegler, T., Toledo, J. F., Torrent, J., Tsamalaidze, Z., Veloso, J. F. C. A., Webb, R., White, J. T., and Yahlali, N. Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives. United States: N. p., 2017. Web. doi:10.1016/j.nima.2017.08.049.
Azevedo, C. D. R., González-Díaz, D., Biagi, S. F., Oliveira, C. A. B., Henriques, C. A. O., Escada, J., Monrabal, F., Gómez-Cadenas, J. J., Álvarez, V., Benlloch-Rodríguez, J. M., Borges, F. I. G. M., Botas, A., Cárcel, S., Carrión, J. V., Cebrián, S., Conde, C. A. N., Díaz, J., Diesburg, M., Esteve, R., Felkai, R., Fernandes, L. M. P., Ferrario, P., Ferreira, A. L., Freitas, E. D. C., Goldschmidt, A., Gutiérrez, R. M., Hauptman, J., Hernandez, A. I., Morata, J. A. Hernando, Herrero, V., Jones, B. J. P., Labarga, L., Laing, A., Lebrun, P., Liubarsky, I., Lopez-March, N., Losada, M., Martín-Albo, J., Martínez-Lema, G., Martínez, A., McDonald, A. D., Monteiro, C. M. B., Mora, F. J., Moutinho, L. M., Vidal, J. Muñoz, Musti, M., Nebot-Guinot, M., Novella, P., Nygren, D., Palmeiro, B., Para, A., Pérez, J., Querol, M., Renner, J., Ripoll, L., Rodríguez, J., Rogers, L., Santos, F. P., dos Santos, J. M. F., Serra, L., Shuman, D., Simón, A., Sofka, C., Sorel, M., Stiegler, T., Toledo, J. F., Torrent, J., Tsamalaidze, Z., Veloso, J. F. C. A., Webb, R., White, J. T., & Yahlali, N. Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives. United States. https://doi.org/10.1016/j.nima.2017.08.049
Azevedo, C. D. R., González-Díaz, D., Biagi, S. F., Oliveira, C. A. B., Henriques, C. A. O., Escada, J., Monrabal, F., Gómez-Cadenas, J. J., Álvarez, V., Benlloch-Rodríguez, J. M., Borges, F. I. G. M., Botas, A., Cárcel, S., Carrión, J. V., Cebrián, S., Conde, C. A. N., Díaz, J., Diesburg, M., Esteve, R., Felkai, R., Fernandes, L. M. P., Ferrario, P., Ferreira, A. L., Freitas, E. D. C., Goldschmidt, A., Gutiérrez, R. M., Hauptman, J., Hernandez, A. I., Morata, J. A. Hernando, Herrero, V., Jones, B. J. P., Labarga, L., Laing, A., Lebrun, P., Liubarsky, I., Lopez-March, N., Losada, M., Martín-Albo, J., Martínez-Lema, G., Martínez, A., McDonald, A. D., Monteiro, C. M. B., Mora, F. J., Moutinho, L. M., Vidal, J. Muñoz, Musti, M., Nebot-Guinot, M., Novella, P., Nygren, D., Palmeiro, B., Para, A., Pérez, J., Querol, M., Renner, J., Ripoll, L., Rodríguez, J., Rogers, L., Santos, F. P., dos Santos, J. M. F., Serra, L., Shuman, D., Simón, A., Sofka, C., Sorel, M., Stiegler, T., Toledo, J. F., Torrent, J., Tsamalaidze, Z., Veloso, J. F. C. A., Webb, R., White, J. T., and Yahlali, N. Thu . "Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives". United States. https://doi.org/10.1016/j.nima.2017.08.049. https://www.osti.gov/servlets/purl/1468421.
@article{osti_1468421,
title = {Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives},
author = {Azevedo, C. D. R. and González-Díaz, D. and Biagi, S. F. and Oliveira, C. A. B. and Henriques, C. A. O. and Escada, J. and Monrabal, F. and Gómez-Cadenas, J. J. and Álvarez, V. and Benlloch-Rodríguez, J. M. and Borges, F. I. G. M. and Botas, A. and Cárcel, S. and Carrión, J. V. and Cebrián, S. and Conde, C. A. N. and Díaz, J. and Diesburg, M. and Esteve, R. and Felkai, R. and Fernandes, L. M. P. and Ferrario, P. and Ferreira, A. L. and Freitas, E. D. C. and Goldschmidt, A. and Gutiérrez, R. M. and Hauptman, J. and Hernandez, A. I. and Morata, J. A. Hernando and Herrero, V. and Jones, B. J. P. and Labarga, L. and Laing, A. and Lebrun, P. and Liubarsky, I. and Lopez-March, N. and Losada, M. and Martín-Albo, J. and Martínez-Lema, G. and Martínez, A. and McDonald, A. D. and Monteiro, C. M. B. and Mora, F. J. and Moutinho, L. M. and Vidal, J. Muñoz and Musti, M. and Nebot-Guinot, M. and Novella, P. and Nygren, D. and Palmeiro, B. and Para, A. and Pérez, J. and Querol, M. and Renner, J. and Ripoll, L. and Rodríguez, J. and Rogers, L. and Santos, F. P. and dos Santos, J. M. F. and Serra, L. and Shuman, D. and Simón, A. and Sofka, C. and Sorel, M. and Stiegler, T. and Toledo, J. F. and Torrent, J. and Tsamalaidze, Z. and Veloso, J. F. C. A. and Webb, R. and White, J. T. and Yahlali, N.},
abstractNote = {We introduce a simulation framework for the transport of high and low energy electrons in xenon-based optical time projection chambers (OTPCs). The simulation relies on elementary cross sections (electron–atom and electron–molecule) and incorporates, in order to compute the gas scintillation, the reaction/quenching rates (atom–atom and atom–molecule) of the first 41 excited states of xenon and the relevant associated excimers, together with their radiative cascade. The results compare positively with observations made in pure xenon and its mixtures with CO2 and CF4 in a range of pressures from 0.1 to 10 bar. This work sheds some light on the elementary processes responsible for the primary and secondary xenon-scintillation mechanisms in the presence of additives, that are of interest to the OTPC technology.},
doi = {10.1016/j.nima.2017.08.049},
journal = {Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment},
number = C,
volume = 877,
place = {United States},
year = {Thu Sep 28 00:00:00 EDT 2017},
month = {Thu Sep 28 00:00:00 EDT 2017}
}

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