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Title: Uncertainty analysis of axial temperature and Seebeck coefficient measurements

Authors:
 [1];  [1]; ORCiD logo [2]
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  1. Univ. of Connecticut, Storrs, CT (United States). Dept. of Mechanical Engineering
  2. Univ. of Connecticut, Storrs, CT (United States). Dept. of Mechanical Engineering; Los Alamos National Lab. (LANL), Los Alamos, NM (United States). Center for Integrated Nanotechnologies (CINT)
Publication Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE Office of Science (SC); National Science Foundation (NSF)
OSTI Identifier:
1466272
Alternate Identifier(s):
OSTI ID: 1485393
Report Number(s):
LA-UR-18-27141
Journal ID: ISSN 0034-6748; LA-UR-18-27141
Grant/Contract Number:  
AC52-06NA25396; CAREER-1553987; PD17-0137
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 8; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 30 DIRECT ENERGY CONVERSION; materials; transition metals; vacuum apparatus; thermodynamic processes; thermoelectric effects; thermal conductivity

Citation Formats

Yazdani, Sajad, Kim, Hyun-Young, and Pettes, Michael Thompson. Uncertainty analysis of axial temperature and Seebeck coefficient measurements. United States: N. p., 2018. Web. doi:10.1063/1.5023909.
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Yazdani, Sajad, Kim, Hyun-Young, & Pettes, Michael Thompson. Uncertainty analysis of axial temperature and Seebeck coefficient measurements. United States. https://doi.org/10.1063/1.5023909
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Yazdani, Sajad, Kim, Hyun-Young, and Pettes, Michael Thompson. Mon . "Uncertainty analysis of axial temperature and Seebeck coefficient measurements". United States. https://doi.org/10.1063/1.5023909. https://www.osti.gov/servlets/purl/1466272.
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@article{osti_1466272,
title = {Uncertainty analysis of axial temperature and Seebeck coefficient measurements},
author = {Yazdani, Sajad and Kim, Hyun-Young and Pettes, Michael Thompson},
abstractNote = {},
doi = {10.1063/1.5023909},
journal = {Review of Scientific Instruments},
number = 8,
volume = 89,
place = {United States},
year = {Mon Aug 06 00:00:00 EDT 2018},
month = {Mon Aug 06 00:00:00 EDT 2018}
}
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Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1063/1.5023909
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Cited by: 6 works
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Figures / Tables:

Figure 1 Figure 1: (a) Overview of the experimental methodology modeled in this work. The Seebeck coefficient is obtained by measurement of the (b) temperature difference and (c) thermovoltage through the relationship S=-(V+–V-)/(Thot–Tcold).
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Works referenced in this record:

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    Works referencing / citing this record:

    Enhanced thermoelectric performance in single-crystal-like semiconducting flexible GaAs films
    journal, March 2019

    • Singh, S.; Dutta, P.; Rathi, M.
    • APL Materials, Vol. 7, Issue 3
    • DOI: 10.1063/1.5086061
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      Figures / Tables found in this record:

      Figure 1 (p. 6)figure
      Figure 2 (p. 8)figure
      Figure 3 (p. 10)figure
      Table 1 (p. 11)table
      Figure 4 (p. 12)figure
      Figure 5 (p. 15)figure
      Figure 6 (p. 17)figure
      Table S1 (p. 22)table
      Table S2 (p. 23)table
      Figure S1 (p. 24)figure
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