Probing Perovskite Inhomogeneity beyond the Surface: TOF-SIMS Analysis of Halide Perovskite Photovoltaic Devices
Abstract
Understanding the origins and evolution of inhomogeneity in halide perovskite solar cells appears to be a key to advancing the technology. Time-of-flight secondary-ion mass spectrometry (TOF-SIMS) is one of the few techniques that can obtain chemical information from all components of hybrid organic-inorganic perovskite photovoltaics in one dimension (standard depth profiling), two dimensions (high-resolution 100-nm imaging), as well as three dimensions (tomography combining high-resolution imaging with depth profiling). TOF-SIMS has been used to analyze perovskite photovoltaics made by a variety of methods, and the breadth of insight that can be gained from the technique is illustrated here including: cation uniformity (depth and lateral), changes in chemistry upon alternate processing, changes in chemistry upon degradation, and lateral distribution of additives that passivate grain boundaries. Using TOF-SIMS on multiple perovskite compositions, we show information regarding hybrid perovskite formation as well as inhomogeneity critical to device performance can be extracted providing one of the best proxies for understanding compositional changes resulting from degradation. Here, we also describe in detail the measurement artifacts and recommended best practices that enable unique insight regarding hybrid perovskite solar cell materials and devices.
- Publication Date:
- Research Org.:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- OSTI Identifier:
- 1461790
- Report Number(s):
- NREL/JA-5K00-71513
Journal ID: ISSN 1944-8244
- Grant/Contract Number:
- AC36-08GO28308
- Resource Type:
- Accepted Manuscript
- Journal Name:
- ACS Applied Materials and Interfaces
- Additional Journal Information:
- Journal Volume: 10; Journal Issue: 34; Journal ID: ISSN 1944-8244
- Publisher:
- American Chemical Society (ACS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; 36 MATERIALS SCIENCE; time-of-flight secondary-ion mass spectrometry; TOF-SIMS; perovskites
Citation Formats
Harvey, Steven P., Li, Zhen, Christians, Jeffrey A., Zhu, Kai, Luther, Joseph M., and Berry, Joseph J. Probing Perovskite Inhomogeneity beyond the Surface: TOF-SIMS Analysis of Halide Perovskite Photovoltaic Devices. United States: N. p., 2018.
Web. doi:10.1021/acsami.8b07937.
Harvey, Steven P., Li, Zhen, Christians, Jeffrey A., Zhu, Kai, Luther, Joseph M., & Berry, Joseph J. Probing Perovskite Inhomogeneity beyond the Surface: TOF-SIMS Analysis of Halide Perovskite Photovoltaic Devices. United States. https://doi.org/10.1021/acsami.8b07937
Harvey, Steven P., Li, Zhen, Christians, Jeffrey A., Zhu, Kai, Luther, Joseph M., and Berry, Joseph J. Thu .
"Probing Perovskite Inhomogeneity beyond the Surface: TOF-SIMS Analysis of Halide Perovskite Photovoltaic Devices". United States. https://doi.org/10.1021/acsami.8b07937. https://www.osti.gov/servlets/purl/1461790.
@article{osti_1461790,
title = {Probing Perovskite Inhomogeneity beyond the Surface: TOF-SIMS Analysis of Halide Perovskite Photovoltaic Devices},
author = {Harvey, Steven P. and Li, Zhen and Christians, Jeffrey A. and Zhu, Kai and Luther, Joseph M. and Berry, Joseph J.},
abstractNote = {Understanding the origins and evolution of inhomogeneity in halide perovskite solar cells appears to be a key to advancing the technology. Time-of-flight secondary-ion mass spectrometry (TOF-SIMS) is one of the few techniques that can obtain chemical information from all components of hybrid organic-inorganic perovskite photovoltaics in one dimension (standard depth profiling), two dimensions (high-resolution 100-nm imaging), as well as three dimensions (tomography combining high-resolution imaging with depth profiling). TOF-SIMS has been used to analyze perovskite photovoltaics made by a variety of methods, and the breadth of insight that can be gained from the technique is illustrated here including: cation uniformity (depth and lateral), changes in chemistry upon alternate processing, changes in chemistry upon degradation, and lateral distribution of additives that passivate grain boundaries. Using TOF-SIMS on multiple perovskite compositions, we show information regarding hybrid perovskite formation as well as inhomogeneity critical to device performance can be extracted providing one of the best proxies for understanding compositional changes resulting from degradation. Here, we also describe in detail the measurement artifacts and recommended best practices that enable unique insight regarding hybrid perovskite solar cell materials and devices.},
doi = {10.1021/acsami.8b07937},
journal = {ACS Applied Materials and Interfaces},
number = 34,
volume = 10,
place = {United States},
year = {Thu Jul 19 00:00:00 EDT 2018},
month = {Thu Jul 19 00:00:00 EDT 2018}
}
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