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Title: A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution

Abstract

We present an extreme ultraviolet (EUV) microscope using a Schwarzschild objective which is optimized for single-shot sub-micrometer imaging of laser-plasma targets. The microscope has been designed and constructed for imaging the scattering from an EUV-heated solid-density hydrogen jet. Imaging of a cryogenic hydrogen target was demonstrated using single pulses of the free-electron laser in Hamburg (FLASH) free-electron laser at a wavelength of 13.5 nm. In a single exposure, we observe a hydrogen jet with ice fragments with a spatial resolution in the sub-micrometer range. In situ EUV imaging is expected to enable novel experimental capabilities for warm dense matter studies of micrometer-sized samples in laser-plasma experiments.

Authors:
ORCiD logo [1];  [2];  [1];  [3];  [1];  [4];  [5];  [6];  [3];  [7];  [8];  [7];  [9];  [1];  [1];  [10];  [6]; ORCiD logo [11];  [7];  [12] more »;  [6];  [6];  [3];  [3];  [13];  [14];  [8]; ORCiD logo [15];  [6];  [13];  [8];  [14];  [7];  [12] « less
  1. European X-ray Free-Electron Laser (XFEL), Schenefeld (Germany)
  2. Friedrich Schiller Univ., Jena (Germany). Inst. of Optics and Quantum Electronics; SLAC National Accelerator Lab., Menlo Park, CA (United States); Helmholtz Inst. Jena, Jena (Germany)
  3. optiX fab GmbH, Jena (Germany)
  4. China Academy of Engineering Physics, Mianyang (China)
  5. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  6. Univ. of Rostock (Germany). Inst. fur Physik
  7. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  8. Friedrich Schiller Univ., Jena (Germany). Inst. of Optics and Quantum Electronics; Helmholtz Inst. Jena, Jena (Germany)
  9. Univ. of Warwick, Coventry (United Kingdom). Centre for Fusion, Space and Astrophysics, Dept. of Physics
  10. Friedrich Schiller Univ., Jena (Germany). Inst. of Applied Physics
  11. Hamburg Centre for Ultrafast Imaging CUI, Hamburg (Germany)
  12. Univ. of Oxford (United Kingdom). Clarendon Lab., Dept. of Physics
  13. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  14. Westfalische Wilhelms-Univ., Munster (Germany). Physikalisches Inst.
  15. Univ. of Rostock (Germany). Inst. fur Physik; Tanta Univ., Tanta (Egypt). Dept. of Physics, Faculty of Science
Publication Date:
Research Org.:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Fusion Energy Sciences (FES); Volkswagen Foundation
OSTI Identifier:
1430988
Alternate Identifier(s):
OSTI ID: 1419609
Report Number(s):
LLNL-JRNL-740214
Journal ID: ISSN 0034-6748; TRN: US1802639
Grant/Contract Number:  
AC52-07NA27344; 654220; FWP100182
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 70 PLASMA PHYSICS AND FUSION

Citation Formats

Zastrau, U., Rodel, C., Nakatsutsumi, M., Feigl, T., Appel, K., Chen, B., Doppner, T., Fennel, T., Fiedler, T., Fletcher, L. B., Forster, E., Gamboa, E., Gericke, D. O., Gode, S., Grote-Fortmann, C., Hilbert, V., Kazak, L., Laarmann, T., Lee, H. J., Mabey, P., Martinez, F., Meiwes-Broer, K. -H., Pauer, H., Perske, M., Przystawik, A., Roling, S., Skruszewicz, S., Shihab, M., Tiggesbaumker, J., Toleikis, S., Wunsche, M., Zacharias, H., Glenzer, S. H., and Gregori, G. A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution. United States: N. p., 2018. Web. doi:10.1063/1.5007950.
Zastrau, U., Rodel, C., Nakatsutsumi, M., Feigl, T., Appel, K., Chen, B., Doppner, T., Fennel, T., Fiedler, T., Fletcher, L. B., Forster, E., Gamboa, E., Gericke, D. O., Gode, S., Grote-Fortmann, C., Hilbert, V., Kazak, L., Laarmann, T., Lee, H. J., Mabey, P., Martinez, F., Meiwes-Broer, K. -H., Pauer, H., Perske, M., Przystawik, A., Roling, S., Skruszewicz, S., Shihab, M., Tiggesbaumker, J., Toleikis, S., Wunsche, M., Zacharias, H., Glenzer, S. H., & Gregori, G. A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution. United States. https://doi.org/10.1063/1.5007950
Zastrau, U., Rodel, C., Nakatsutsumi, M., Feigl, T., Appel, K., Chen, B., Doppner, T., Fennel, T., Fiedler, T., Fletcher, L. B., Forster, E., Gamboa, E., Gericke, D. O., Gode, S., Grote-Fortmann, C., Hilbert, V., Kazak, L., Laarmann, T., Lee, H. J., Mabey, P., Martinez, F., Meiwes-Broer, K. -H., Pauer, H., Perske, M., Przystawik, A., Roling, S., Skruszewicz, S., Shihab, M., Tiggesbaumker, J., Toleikis, S., Wunsche, M., Zacharias, H., Glenzer, S. H., and Gregori, G. Mon . "A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution". United States. https://doi.org/10.1063/1.5007950. https://www.osti.gov/servlets/purl/1430988.
@article{osti_1430988,
title = {A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution},
author = {Zastrau, U. and Rodel, C. and Nakatsutsumi, M. and Feigl, T. and Appel, K. and Chen, B. and Doppner, T. and Fennel, T. and Fiedler, T. and Fletcher, L. B. and Forster, E. and Gamboa, E. and Gericke, D. O. and Gode, S. and Grote-Fortmann, C. and Hilbert, V. and Kazak, L. and Laarmann, T. and Lee, H. J. and Mabey, P. and Martinez, F. and Meiwes-Broer, K. -H. and Pauer, H. and Perske, M. and Przystawik, A. and Roling, S. and Skruszewicz, S. and Shihab, M. and Tiggesbaumker, J. and Toleikis, S. and Wunsche, M. and Zacharias, H. and Glenzer, S. H. and Gregori, G.},
abstractNote = {We present an extreme ultraviolet (EUV) microscope using a Schwarzschild objective which is optimized for single-shot sub-micrometer imaging of laser-plasma targets. The microscope has been designed and constructed for imaging the scattering from an EUV-heated solid-density hydrogen jet. Imaging of a cryogenic hydrogen target was demonstrated using single pulses of the free-electron laser in Hamburg (FLASH) free-electron laser at a wavelength of 13.5 nm. In a single exposure, we observe a hydrogen jet with ice fragments with a spatial resolution in the sub-micrometer range. In situ EUV imaging is expected to enable novel experimental capabilities for warm dense matter studies of micrometer-sized samples in laser-plasma experiments.},
doi = {10.1063/1.5007950},
journal = {Review of Scientific Instruments},
number = 2,
volume = 89,
place = {United States},
year = {Mon Feb 05 00:00:00 EST 2018},
month = {Mon Feb 05 00:00:00 EST 2018}
}

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Cited by: 8 works
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Figures / Tables:

Figure 1 Figure 1: Schematics of a Schwarzschild objective.

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Works referenced in this record:

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Works referencing / citing this record:

Ionization dynamics of dense matter generated by intense ultrashort X-ray pulses
journal, February 2019

  • Shihab, Mohammed; Bornath, Thomas; Redmer, Ronald
  • Contributions to Plasma Physics, Vol. 59, Issue 4-5
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Characterization of high spatial resolution lithium fluoride X-ray detectors
journal, June 2019

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  • Review of Scientific Instruments, Vol. 90, Issue 6
  • DOI: 10.1063/1.5092265

Full-field microscope with twin Wolter mirrors for soft X-ray free-electron lasers
journal, January 2019

  • Egawa, Satoru; Owada, Shigeki; Motoyama, Hiroto
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  • DOI: 10.1364/oe.27.033889

Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy
journal, November 2020

  • Ruiz-Lopez, Mabel; Mehrjoo, Masoud; Keitel, Barbara
  • Sensors, Vol. 20, Issue 22
  • DOI: 10.3390/s20226426

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