Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction.

Weeden-Wright, S. L.; King, Michael Patrick; Hooten, N. C.; Bennett, W. G.; Sierawski, B. D.; Schrimpf, R. D.; Weller, R. A.; Reed, R. A.; Mendenhall, M. H.; Fleetwood, D. M.; Alles, M. L.; Baumann, R. C.

doi:10.1109/TNS.2015.2472296

Title: Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction.

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Abstract

Variability in energy deposition from stopping ions and LET fluctuations is quantified for specific radiation environments. When compared to predictions using average LET via CREME96, LET fluctuations lead to an order-of-magnitude difference in effective flux and a nearly 4x decrease in predicted soft error rate (SER) in an example calculation performed on a commercial 65 nm SRAM. The large LET fluctuations reported here will be even greater for the smaller sensitive volumes that are characteristic of highly scaled technologies. End-of-range effects of stopping ions do not lead to significant inaccuracies in radiation environments with low solar activity unless the sensitivevolume thickness is 100 μm or greater. In contrast, end-of-range effects for stopping ions lead to significant inaccuracies for sensitive- volume thicknesses less than 10 μm in radiation environments with high solar activity.

Authors:

Weeden-Wright, S. L. ^[1]; King, Michael Patrick ^[2]; Hooten, N. C. ^[3]; Bennett, W. G. ^[4]; Sierawski, B. D. ^[1]; Schrimpf, R. D. ^[1]; Weller, R. A. ^[1]; Reed, R. A. ^[1]; Mendenhall, M. H. ^[5]; Fleetwood, D. M. ^[1]; Alles, M. L. ^[1]; Baumann, R. C. ^[6]

Vanderbilt Univ., Nashville, TN (United States)
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Dynetics, Inc., Huntsville, AL (United States)
Intel Corp, Santa Clara, CA (United States)
National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
Texas Instruments Inc., Dallas, TX (United States)

Publication Date:: Sun Feb 01 00:00:00 EST 2015

Research Org.:: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Sponsoring Org.:: USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:: 1427234

Report Number(s):: SAND-2015-0718J
Journal ID: ISSN 0018-9499; 563556; TRN: US1802980

Grant/Contract Number:: AC04-94AL85000

Resource Type:: Accepted Manuscript

Journal Name:: IEEE Transactions on Nuclear Science

Additional Journal Information:: Journal Volume: 62; Journal Issue: 5; Journal ID: ISSN 0018-9499

Publisher:: IEEE

Country of Publication:: United States

Language:: English

Subject:: 42 ENGINEERING

Citation Formats


                    Weeden-Wright, S. L., King, Michael Patrick, Hooten, N. C., Bennett, W. G., Sierawski, B. D., Schrimpf, R. D., Weller, R. A., Reed, R. A., Mendenhall, M. H., Fleetwood, D. M., Alles, M. L., and Baumann, R. C. Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction..  United States: N. p., 2015. 
Web.  doi:10.1109/TNS.2015.2472296.

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                    Weeden-Wright, S. L., King, Michael Patrick, Hooten, N. C., Bennett, W. G., Sierawski, B. D., Schrimpf, R. D., Weller, R. A., Reed, R. A., Mendenhall, M. H., Fleetwood, D. M., Alles, M. L., & Baumann, R. C. Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction..  United States.  https://doi.org/10.1109/TNS.2015.2472296

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                    Weeden-Wright, S. L., King, Michael Patrick, Hooten, N. C., Bennett, W. G., Sierawski, B. D., Schrimpf, R. D., Weller, R. A., Reed, R. A., Mendenhall, M. H., Fleetwood, D. M., Alles, M. L., and Baumann, R. C. Sun .  
"Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction.".  United States.  https://doi.org/10.1109/TNS.2015.2472296.  https://www.osti.gov/servlets/purl/1427234.

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@article{osti_1427234,

  title        = {Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction.},

  author       = {Weeden-Wright, S. L. and King, Michael Patrick and Hooten, N. C. and Bennett, W. G. and Sierawski, B. D. and Schrimpf, R. D. and Weller, R. A. and Reed, R. A. and Mendenhall, M. H. and Fleetwood, D. M. and Alles, M. L. and Baumann, R. C.},

  abstractNote = {Variability in energy deposition from stopping ions and LET fluctuations is quantified for specific radiation environments. When compared to predictions using average LET via CREME96, LET fluctuations lead to an order-of-magnitude difference in effective flux and a nearly 4x decrease in predicted soft error rate (SER) in an example calculation performed on a commercial 65 nm SRAM. The large LET fluctuations reported here will be even greater for the smaller sensitive volumes that are characteristic of highly scaled technologies. End-of-range effects of stopping ions do not lead to significant inaccuracies in radiation environments with low solar activity unless the sensitivevolume thickness is 100 μm or greater. In contrast, end-of-range effects for stopping ions lead to significant inaccuracies for sensitive- volume thicknesses less than 10 μm in radiation environments with high solar activity.},

  doi          = {10.1109/TNS.2015.2472296},

  journal      = {IEEE Transactions on Nuclear Science},

  number       = 5,

  volume       = 62,

  place        = {United States},

  year         = {Sun Feb 01 00:00:00 EST 2015},

  month        = {Sun Feb 01 00:00:00 EST 2015}

}

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