Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors

Dunham, Greg; Bailey, J. E.; Rochau, G. A.; Lake, P. W.; Nielsen-Weber, L. B.

doi:10.1063/1.2748674

Title: Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors

Abstract

Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. Also, this large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented in this paper.

Authors:

Dunham, Greg ^[1]; Bailey, J. E. ^[2]; Rochau, G. A. ^[2]; Lake, P. W. ^[2]; Nielsen-Weber, L. B. ^[1]

Ktech Corp., Albuquerque, NM (United States)
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Publication Date:: Wed Jun 27 00:00:00 EDT 2007

Research Org.:: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Sponsoring Org.:: USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:: 1427012

Report Number(s):: SAND2007-0241J
Journal ID: ISSN 0034-6748; 524295

Grant/Contract Number:: AC04-94AL85000

Resource Type:: Accepted Manuscript

Journal Name:: Review of Scientific Instruments

Additional Journal Information:: Journal Volume: 78; Journal Issue: 6; Journal ID: ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; x-ray spectra; luminescence; phosphors; photoluminescence; optical imaging; spatial resolution; optical metrology; plasma confinement; plasma devices; electromagnetic radiation detectors

Citation Formats


                    Dunham, Greg, Bailey, J. E., Rochau, G. A., Lake, P. W., and Nielsen-Weber, L. B. Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors.  United States: N. p., 2007. 
Web.  doi:10.1063/1.2748674.

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                    Dunham, Greg, Bailey, J. E., Rochau, G. A., Lake, P. W., & Nielsen-Weber, L. B. Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors.  United States.  https://doi.org/10.1063/1.2748674

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                    Dunham, Greg, Bailey, J. E., Rochau, G. A., Lake, P. W., and Nielsen-Weber, L. B. Wed .  
"Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors".  United States.  https://doi.org/10.1063/1.2748674.  https://www.osti.gov/servlets/purl/1427012.

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@article{osti_1427012,

  title        = {Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors},

  author       = {Dunham, Greg and Bailey, J. E. and Rochau, G. A. and Lake, P. W. and Nielsen-Weber, L. B.},

  abstractNote = {Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. Also, this large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented in this paper.},

  doi          = {10.1063/1.2748674},

  journal      = {Review of Scientific Instruments},

  number       = 6,

  volume       = 78,

  place        = {United States},

  year         = {Wed Jun 27 00:00:00 EDT 2007},

  month        = {Wed Jun 27 00:00:00 EDT 2007}

}

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Works referenced in this record:

Dynamic hohlraum driven inertial fusion capsules
journal, May 2003

Slutz, S. A.; Bailey, J. E.; Chandler, G. A.
Physics of Plasmas, Vol. 10, Issue 5
DOI: 10.1063/1.1565117

Dynamic hohlraum radiation hydrodynamics
journal, May 2006

Bailey, J. E.; Chandler, G. A.; Mancini, R. C.
Physics of Plasmas, Vol. 13, Issue 5
DOI: 10.1063/1.2177640

Hot Dense Capsule-Implosion Cores Produced by $Z$ -Pinch Dynamic Hohlraum Radiation
journal, February 2004

Bailey, J. E.; Chandler, G. A.; Slutz, S. A.
Physical Review Letters, Vol. 92, Issue 8, Article No. 085002
DOI: 10.1103/PhysRevLett.92.085002

Twin-elliptical-crystal time- and space-resolved soft x-ray spectrometer
journal, October 2006

Lake, P. W.; Bailey, J. E.; Rochau, G. A.
Review of Scientific Instruments, Vol. 77, Issue 10
DOI: 10.1063/1.2227444

X-ray imaging of targets irradiated by the Nike KrF laser
journal, January 1997

Brown, C.; Seely, J.; Feldman, U.
Review of Scientific Instruments, Vol. 68, Issue 1
DOI: 10.1063/1.1147796

Principles of Plasma Spectroscopy
book, January 1997

Griem, Hans R.
DOI: 10.1017/CBO9780511524578

Measurements of the counting statistics on RAR-2497 and DEF x-ray film
journal, October 2004

Dunham, Greg; Rochau, G. A.; Lake, P.
Review of Scientific Instruments, Vol. 75, Issue 10
DOI: 10.1063/1.1788865

Energy dependent sensitivity of microchannel plate detectors
journal, October 2006

Rochau, G. A.; Bailey, J. E.; Chandler, G. A.
Review of Scientific Instruments, Vol. 77, Issue 10
DOI: 10.1063/1.2336461

Measurement and analysis of x-ray absorption in Al and ${MgF}_{2}$ plasmas heated by $Z$ -pinch radiation
journal, December 2005

Rochau, Gregory A.; Bailey, J. E.; MacFarlane, J. J.
Physical Review E, Vol. 72, Issue 6
DOI: 10.1103/PhysRevE.72.066405

High speed proximity focused X-ray cameras
journal, March 1991

Kilkenny, J. D.
Laser and Particle Beams, Vol. 9, Issue 1
DOI: 10.1017/S0263034600002330

Time- and space-resolved elliptical crystal spectrometers for high energy density physics research
journal, October 2004

Lake, P. W.; Bailey, J. E.; Rochau, G. A.
Review of Scientific Instruments, Vol. 75, Issue 10
DOI: 10.1063/1.1788866

Works referencing / citing this record:

Diagnosis of x-ray heated Mg/Fe opacity research plasmas
journal, November 2008

Bailey, J. E.; Rochau, G. A.; Mancini, R. C.
Review of Scientific Instruments, Vol. 79, Issue 11
DOI: 10.1063/1.3020710

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Similar Records

Title: Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors

Abstract

Citation Formats

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